Anin situatomic force microscope for normal-incidence nanofocus X-ray experiments

2016 ◽  
Vol 23 (5) ◽  
pp. 1110-1117 ◽  
Author(s):  
M. V. Vitorino ◽  
Y. Fuchs ◽  
T. Dane ◽  
M. S. Rodrigues ◽  
M. Rosenthal ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
High Speed ◽  
Normal Incidence ◽  
Organic Thin Film ◽  
X Ray ◽  
Atomic Force ◽  
Synchrotron Beamlines

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.

High Speed Characterization of Organic Thin Film Transistors

2006 ◽  
Author(s):  
Debarshi Basu ◽  
Liang Wang ◽  
Lawrence Dunn ◽  
Ananth Dodabalapur ◽  
Martin Heeney ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
High Speed ◽  
Organic Thin Film Transistors ◽  
Organic Thin Film

Integrated atomic force microscopy and x-ray irradiation for in situ characterization of radiation-induced processes

2021 ◽  
Vol 92 (11) ◽  
pp. 113701
Author(s):  
Shawn L. Riechers ◽  
Nikolai Petrik ◽  
John S. Loring ◽  
Mark K. Murphy ◽  
Carolyn I. Pearce ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
In Situ Characterization ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Radiation Induced

scholarly journals Atom Scale Characterization of the Near Apex Region of an Atomic Force Microscope Tip

2010 ◽  
Vol 16 (5) ◽  
pp. 636-642 ◽  
Author(s):  
Christopher J. Tourek ◽  
Sriram Sundararajan
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Atom Probe ◽  
Material Structure ◽  
Atomic Force ◽  
Transmission Electron ◽  
Afm Tips ◽  
Scale Characterization

AbstractThree-dimensional atom probe tomography (APT) is successfully used to analyze the near-apex regions of an atomic force microscope (AFM) tip. Atom scale material structure and chemistry from APT analysis for standard silicon AFM tips and silicon AFM tips coated with a thin film of Cu is presented. Comparison of the thin film data with that observed using transmission electron microscopy indicates that APT can be reliably used to investigate the material structure and chemistry of the apex of an AFM tip at near atomic scales.

scholarly journals Scanning force microscope forin situnanofocused X-ray diffraction studies

2014 ◽  
Vol 21 (5) ◽  
pp. 1128-1133 ◽  
Author(s):  
Zhe Ren ◽  
Francesca Mastropietro ◽  
Anton Davydok ◽  
Simon Langlais ◽  
Marie-Ingrid Richard ◽  
...  
Keyword(s):  
Sapphire Substrate ◽  
Third Generation ◽  
X Ray Diffraction ◽  
Scanning Force Microscope ◽  
Atomic Lattice ◽  
X Ray ◽  
Atomic Force ◽  
Scanning Force ◽  
Synchrotron Beamlines

A compact scanning force microscope has been developed forin situcombination with nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its capabilities are demonstrated on Au nano-islands grown on a sapphire substrate. The newin situdevice allows forin situimaging the sample topography and the crystallinity by recording simultaneously an atomic force microscope (AFM) image and a scanning X-ray diffraction map of the same area. Moreover, a selected Au island can be mechanically deformed using the AFM tip while monitoring the deformation of the atomic lattice by nanofocused X-ray diffraction. Thisin situapproach gives access to the mechanical behavior of nanomaterials.

scholarly journals Local detection of X-ray spectroscopies with an in-situ Atomic Force Microscope

2008 ◽  
Vol 3 (12) ◽  
pp. P12004-P12004 ◽  
Author(s):  
M S Rodrigues ◽  
O Dhez ◽  
S Le Denmat ◽  
J Chevrier ◽  
R Felici ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
X Ray ◽  
Atomic Force ◽  
Local Detection

In situ characterization of the film coverage and the charge transport in the alkylated-organic thin film transistor

2018 ◽  
Vol 57 (3S2) ◽  
pp. 03EG14 ◽  
Author(s):  
Takeshi Watanabe ◽  
Tomoyuki Koganezawa ◽  
Mamoru Kikuchi ◽  
Hiroki Muraoka ◽  
Satoshi Ogawa ◽  
...  
Keyword(s):  
Thin Film ◽  
Charge Transport ◽  
Thin Film Transistor ◽  
Organic Thin Film ◽  
Organic Thin Film Transistor ◽  
In Situ Characterization
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