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Anomalous low energy phonon dispersion in bulk silicon-germanium observed by inelastic x-ray scattering
Applied Physics Letters
◽
10.1063/5.0010506
◽
2020
◽
Vol 116
(24)
◽
pp. 242104
Author(s):
R. Yokogawa
◽
H. Takeuchi
◽
Y. Arai
◽
I. Yonenaga
◽
M. Tomita
◽
...
Keyword(s):
Silicon Germanium
◽
Phonon Dispersion
◽
Low Energy
◽
Bulk Silicon
◽
X Ray
◽
X Ray Scattering
◽
Ray Scattering
Download Full-text
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References
Evaluation of Phonon Dispersion Relation for Bulk Silicon Germanium by Inelastic X-ray Scattering
ECS Transactions
◽
10.1149/09805.0465ecst
◽
2020
◽
Vol 98
(5)
◽
pp. 465-472
Author(s):
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◽
Haruki Takeuchi
◽
Yasutomo Arai
◽
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◽
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Keyword(s):
Dispersion Relation
◽
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◽
Phonon Dispersion
◽
Bulk Silicon
◽
X Ray
◽
Phonon Dispersion Relation
◽
X Ray Scattering
◽
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Evaluation of Phonon Dispersion Relation for Bulk Silicon Germanium by Inelastic X-ray Scattering
ECS Meeting Abstracts
◽
10.1149/ma2020-02241773mtgabs
◽
2020
◽
Vol MA2020-02
(24)
◽
pp. 1773-1773
Author(s):
Ryo Yokogawa
◽
Haruki Takeuchi
◽
Yasutomo Arai
◽
Ichiro Yonenaga
◽
Hiroshi Uchiyama
◽
...
Keyword(s):
Dispersion Relation
◽
Silicon Germanium
◽
Phonon Dispersion
◽
Bulk Silicon
◽
X Ray
◽
Phonon Dispersion Relation
◽
X Ray Scattering
◽
Ray Scattering
Download Full-text
Phonon dispersion and low-energy anomaly inCaC6from inelastic neutron and x-ray scattering experiments
Physical Review B
◽
10.1103/physrevb.81.104519
◽
2010
◽
Vol 81
(10)
◽
Cited By ~ 9
Author(s):
Matteo d’Astuto
◽
Matteo Calandra
◽
Nedjma Bendiab
◽
Geneviève Loupias
◽
Francesco Mauri
◽
...
Keyword(s):
Phonon Dispersion
◽
Inelastic Neutron
◽
Low Energy
◽
X Ray
◽
X Ray Scattering
◽
Ray Scattering
Download Full-text
Comparative anomalous small-angle x-ray scattering study of hotwire and plasma grown amorphous silicon–germanium alloys
Journal of Applied Physics
◽
10.1063/1.1413488
◽
2001
◽
Vol 90
(11)
◽
pp. 5808-5811
◽
Cited By ~ 12
Author(s):
G. Goerigk
◽
D. L. Williamson
Keyword(s):
Amorphous Silicon
◽
Small Angle
◽
Silicon Germanium
◽
X Ray
◽
X Ray Scattering
◽
Scattering Study
◽
Amorphous Silicon Germanium
◽
Silicon Germanium Alloys
◽
Ray Scattering
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X-ray scattering by the fused silica surface etched by low-energy Ar ions
Journal of X-Ray Science and Technology
◽
10.3233/xst-190495
◽
2019
◽
Vol 27
(5)
◽
pp. 857-870
◽
Cited By ~ 2
Author(s):
M.M. Barysheva
◽
N.I. Chkhalo
◽
M.N. Drozdov
◽
M.S. Mikhailenko
◽
A.E. Pestov
◽
...
Keyword(s):
Silica Surface
◽
Fused Silica
◽
Low Energy
◽
X Ray
◽
X Ray Scattering
◽
Ray Scattering
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Phonon dispersion curves in α-SiO2 and hcp 3He and 4He determined by inelastic X-ray scattering
Physica B Condensed Matter
◽
10.1016/s0921-4526(98)01399-4
◽
1999
◽
Vol 263-264
◽
pp. 412-415
◽
Cited By ~ 14
Author(s):
E Burkel
◽
C Seyfert
◽
Ch Halcoussis
◽
H Sinn
◽
R.O Simmons
Keyword(s):
Phonon Dispersion
◽
Dispersion Curves
◽
Phonon Dispersion Curves
◽
X Ray
◽
X Ray Scattering
◽
Ray Scattering
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Anomalous X-ray scattering study of quantum dots embedded in MBE grown silicon/germanium multilayers
10.1063/1.4791249
◽
2013
◽
Author(s):
Manjula Sharma
◽
Milan K. Sanyal
◽
Mrinmay K. Mukhopadhyay
Keyword(s):
Quantum Dots
◽
Silicon Germanium
◽
X Ray
◽
X Ray Scattering
◽
Scattering Study
◽
Ray Scattering
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Depth-Resolved Structure Analysis of Cylindrical Microdomain in Block Copolymer Thin Film by Grazing-Incidence Small-Angle X-ray Scattering Utilizing Low-Energy X-rays
Macromolecules
◽
10.1021/acs.macromol.5b01883
◽
2015
◽
Vol 48
(22)
◽
pp. 8190-8196
◽
Cited By ~ 20
Author(s):
Itsuki Saito
◽
Tsukasa Miyazaki
◽
Katsuhiro Yamamoto
Keyword(s):
Thin Film
◽
Block Copolymer
◽
Structure Analysis
◽
Small Angle
◽
Grazing Incidence
◽
Low Energy
◽
X Rays
◽
X Ray
◽
X Ray Scattering
◽
Ray Scattering
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Small-angle X-ray scattering of two-phase atomistic models for amorphous silicon–germanium alloys
Journal of Non-Crystalline Solids
◽
10.1016/j.jnoncrysol.2015.02.007
◽
2015
◽
Vol 416
◽
pp. 4-13
◽
Cited By ~ 3
Author(s):
R. Ben Brahim
◽
A. Chehaidar
Keyword(s):
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◽
Small Angle
◽
Silicon Germanium
◽
Two Phase
◽
X Ray
◽
X Ray Scattering
◽
Atomistic Models
◽
Amorphous Silicon Germanium
◽
Silicon Germanium Alloys
◽
Ray Scattering
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Temperature induced differences in the nanostructure of hot-wire deposited silicon-germanium alloys analyzed by anomalous small-angle x-ray scattering
Journal of Applied Physics
◽
10.1063/1.2187088
◽
2006
◽
Vol 99
(8)
◽
pp. 084309
◽
Cited By ~ 16
Author(s):
G. Goerigk
◽
D. L. Williamson
Keyword(s):
Small Angle
◽
Silicon Germanium
◽
Hot Wire
◽
X Ray
◽
X Ray Scattering
◽
Silicon Germanium Alloys
◽
Ray Scattering
Download Full-text
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