Investigation of the electronic states of A-site layer-ordered double perovskite YBaCo2Ox (x = 5.3 and 6) thin films by x-ray spectroscopy

2021 ◽  
Vol 118 (1) ◽  
pp. 012401
Author(s):  
Akira Chikamatsu ◽  
Tsukasa Katayama ◽  
Takahiro Maruyama ◽  
Miho Kitamura ◽  
Koji Horiba ◽  
...  
Keyword(s):  
Thin Films ◽  
Electronic States ◽  
Double Perovskite ◽  
X Ray ◽  
A Site

Molybdenum x-ray emission spectroscopic study of vacancy-induced electronic states in V2O5-MoO3 thin films and powders

2000 ◽  
Vol 29 (4) ◽  
pp. 279-284 ◽  
Author(s):  
B. S. Acharya ◽  
Rajeev ◽  
L. D. Pradhan ◽  
Pusparani Mishra ◽  
B. B. Nayak
Keyword(s):  
Thin Films ◽  
Spectroscopic Study ◽  
Electronic States ◽  
X Ray

The Control of Electronic States Spreading Outside the Conjugated Polymer Surface

2006 ◽  
Vol 965 ◽  
Author(s):  
Xiao Tao Hao ◽  
Takuya Hosokai ◽  
Noritaka Mitsuo ◽  
Satoshi Kera ◽  
Kazuyuki Sakamoto ◽  
...  
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Electronic Structures ◽  
Conjugated Polymer ◽  
Polymer Surface ◽  
Electronic States ◽  
Penning Ionization ◽  
X Ray ◽  
Molecular Ordering ◽  
X Ray Absorption

ABSTRACTThe surface electronic structures of conjugated regio regular and regio random poly (3- hexylthiophene) (rr-P3HT and rra-P3HT) thin films were studied by near edge X-ray absorption fine structure spectroscopy, ultraviolet photoelectron spectroscopy and Penning ionization electron spectroscopy (PIES). The distribution of the surface electronic states was controlled on rr-P3HT and rra-P3HT thin films with different molecular ordering by varying the coating process and PIES was adopted to observe the electronic states existing outside the surface.

Investigation of electronic states of infinite-layer SrFeO2 epitaxial thin films by X-ray photoemission and absorption spectroscopies

2012 ◽  
Vol 184 (11-12) ◽  
pp. 547-550 ◽  
Author(s):  
Akira Chikamatsu ◽  
Toshiya Matsuyama ◽  
Yasushi Hirose ◽  
Hiroshi Kumigashira ◽  
Masaharu Oshima ◽  
...  
Keyword(s):  
Thin Films ◽  
Electronic States ◽  
Epitaxial Thin Films ◽  
X Ray ◽  
Infinite Layer

Study of electronic states for V thin films deposited on 6H-SiC substrates by soft X-ray emission spectroscopy

2009 ◽  
Vol 256 (4) ◽  
pp. 948-949 ◽  
Author(s):  
M. Hirai ◽  
H. Okazaki ◽  
R. Yoshida ◽  
M. Tajima ◽  
K. Saeki ◽  
...  
Keyword(s):  
Thin Films ◽  
Emission Spectroscopy ◽  
Electronic States ◽  
X Ray

Preparation and Research of Ferroelectric Properties of Fabricated Thin Film by Doping La and Nd to Bi4Ti3O12

2011 ◽  
Vol 287-290 ◽  
pp. 2318-2321
Author(s):  
Shu Lan Guo ◽  
Jia Li ◽  
Xue Dong Xu
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Ferroelectric Properties ◽  
Sol Gel ◽  
X Ray Diffraction ◽  
Random Orientation ◽  
Thin Film Thickness ◽  
Homogeneous Microstructure ◽  
X Ray ◽  
A Site

Ferroelectric thin films Bi3.25La0.75Ti3O12,Bi3.15Nd0.85Ti3O12 and Bi3.15(La0.5Nd0.5)0.85Ti3O12 of A-site substitution of Bi4Ti3O12 were fabricated by sol-gel method in the paper. X-ray diffraction pattern shows the prepared thin films exhibit a highly random orientation with predominantly (117) and (00l) orientation. Pr values of Bi3.25La0.75Ti3O12 、Bi3.15Nd0.85Ti3O12 and Bi3.15(La0.5Nd0.5)0.85Ti3O12 thin films were respectively 13.14μC/cm2, 20.65μC/cm2 and 21.23μC/cm2 at the voltage of 10V.FE-SEM shows that the BNT thin film has a dense and homogeneous microstructure without any crack. The BNT thin film thickness is about 300nm.

Probing the electronic states of high-TMR off-stoichiometric Co2MnSi thin films by hard x-ray photoelectron spectroscopy

2014 ◽  
Vol 89 (12) ◽  
Author(s):  
Xeniya Kozina ◽  
Julie Karel ◽  
Siham Ouardi ◽  
Stanislav Chadov ◽  
Gerhard H. Fecher ◽  
...  
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Electronic States ◽  
X Ray

X-Ray Emission Spectroscopy of the Electronic States in Pb1−xHgxS Thin Films

1989 ◽  
Vol 153 (1) ◽  
pp. 153-160 ◽  
Author(s):  
B. S. Acharya ◽  
S. K. Singh ◽  
B. B. Nayak
Keyword(s):  
Thin Films ◽  
Emission Spectroscopy ◽  
Electronic States ◽  
X Ray

Nb K-edge x-ray absorption investigation of the pressure induced amorphization in A-site deficient double perovskite La1/3NbO3

2016 ◽  
Vol 28 (4) ◽  
pp. 045401 ◽  
Author(s):  
C Marini ◽  
O Noked ◽  
I Kantor ◽  
B Joseph ◽  
O Mathon ◽  
...  
Keyword(s):  
Double Perovskite ◽  
X Ray ◽  
A Site ◽  
X Ray Absorption

A study of electronic states in a-SiOx and a-SiNx thin films by infrared, auger electron and X-ray photoelectron spectroscopies

1985 ◽  
Vol 77-78 ◽  
pp. 929-932 ◽  
Author(s):  
S.S. Chao ◽  
G. Lucovsky ◽  
S.Y. Lin ◽  
C.K. Wong ◽  
P.D. Richard ◽  
...  
Keyword(s):  
Thin Films ◽  
Auger Electron ◽  
Electronic States ◽  
X Ray

scholarly journals Vacancy-induced electronic states in substoichiometric V2 −x Mo x O3 ±y thin films and powders—A soft X-ray emission study

1999 ◽  
Vol 22 (6) ◽  
pp. 981-986 ◽  
Author(s):  
B S Acharya ◽  
Rajeev ◽  
L D Pradhan ◽  
B B Nayak ◽  
Pushparani Mishra
Keyword(s):  
Thin Films ◽  
Electronic States ◽  
X Ray ◽  
Emission Study
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