Damage effect of hafnium oxide gate dielectric based metal–oxide–semiconductor structure under gamma-ray irradiation
2021 ◽
Vol 11
(6)
◽
pp. 065304
2014 ◽
Vol 21
(4)
◽
pp. 1792-1800
◽
Man Ding
◽
Yonghong Cheng
◽
Xin Liu
◽
Xiaolong Li
1991 ◽
Vol 70
(3)
◽
pp. 1309-1312
◽
M. Yoshikawa
◽
H. Itoh
◽
Y. Morita
◽
I. Nashiyama
◽
S. Misawa
◽
...
M. Yoshikawa
◽
Y. Morita
◽
H. Itoh
◽
I. Nashiyama
◽
S. Misawa
◽
...
2021 ◽
Vol 42
(4)
◽
pp. 545-548
Zhe Li
◽
Zhaoqing Feng
◽
Yu Xu
◽
Qian Feng
◽
Weidong Zhu
◽
...
2016 ◽
Vol 122
◽
pp. 56-63
◽
S. Toumi
◽
Z. Ouennoughi
◽
K.C. Strenger
◽
L. Frey
2010 ◽
Vol 42
(2)
◽
pp. 70-76
◽
M. Yoshitake
◽
K. Ohmori
◽
T. Chikyow
2007 ◽
Vol 90
(4)
◽
pp. 042104
◽
W. E. Jellett
◽
K. J. Weber
2021 ◽
Vol 119
(7)
◽
pp. 073504
Meiyong Liao
◽
Liwen Sang
◽
Huanying Sun
◽
Tiefu Li
◽
Satoshi Koizumi
2020 ◽
Vol 51
(1)
◽
pp. 1787-1789
Taewook Kang
◽
Jehong Park
◽
Boowon Park
◽
Jimin Lim
◽
Hyunwoo Kang
◽
...