scholarly journals Inverting dynamic force microscopy: From signals to time-resolved interaction forces

2002 ◽  
Vol 99 (13) ◽  
pp. 8473-8478 ◽  
Author(s):  
M. Stark ◽  
R. W. Stark ◽  
W. M. Heckl ◽  
R. Guckenberger
Keyword(s):  
Dynamic Force ◽  
Interaction Forces ◽  
Time Resolved ◽  
Force Microscopy

Direct Measurement of the Attractive Interaction Forces on F0Color Centers on MgO(001) by Dynamic Force Microscopy

ACS Nano ◽  
2010 ◽  
Vol 4 (5) ◽  
pp. 2510-2514 ◽  
Author(s):  
Thomas König ◽  
Georg H. Simon ◽  
Umberto Martinez ◽  
Livia Giordano ◽  
Gianfranco Pacchioni ◽  
...  
Keyword(s):  
Direct Measurement ◽  
Attractive Interaction ◽  
Dynamic Force ◽  
Interaction Forces ◽  
Force Microscopy

scholarly journals Dynamics of force generation by spreading platelets

Soft Matter ◽  
2018 ◽  
Vol 14 (31) ◽  
pp. 6571-6581 ◽  
Author(s):  
Jana Hanke ◽  
Dimitri Probst ◽  
Assaf Zemel ◽  
Ulrich S. Schwarz ◽  
Sarah Köster
Keyword(s):  
Internal Stress ◽  
Traction Force ◽  
Variable Stiffness ◽  
Human Platelets ◽  
Force Generation ◽  
Dynamic Force ◽  
Time Resolved ◽  
Force Microscopy ◽  
Elastic Substrates ◽  
High Level

Using time-resolved traction force microscopy on soft elastic substrates of variable stiffness, here we show that human platelets generate highly dynamic force patterns and an exceptionally high level of internal stress.

scholarly journals Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

2019 ◽  
Vol 10 ◽  
pp. 617-633 ◽  
Author(s):  
Aaron Mascaro ◽  
Yoichi Miyahara ◽  
Tyler Enright ◽  
Omur E Dagdeviren ◽  
Peter Grütter
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Force ◽  
Oscillation Period ◽  
Electrostatic Force Microscopy ◽  
Time Varying ◽  
Time Resolved ◽  
Battery Materials ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Techniques

Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems. These forces reveal information about dynamic processes happening over nanometer length scales due to the nanometer-sized probe tips used in atomic force microscopy. Here, we review in detail several time-resolved EFM techniques based on non-contact atomic force microscopy, elaborating on their specific limitations and challenges. We also introduce a new experimental technique that can resolve time-varying signals well below the oscillation period of the cantilever and compare and contrast it with those previously established.

Higher Harmonics and Time-Varying Forces in Dynamic Force Microscopy

2010 ◽  
pp. 711-729 ◽  
Author(s):  
Ozgur Sahin ◽  
Calvin F. Quate ◽  
Olav Solgaard ◽  
Franz J. Giessibl
Keyword(s):  
Dynamic Force ◽  
Time Varying ◽  
Higher Harmonics ◽  
Force Microscopy

Nanometre-scale oxidation of silicon surfaces by dynamic force microscopy: reproducibility, kinetics and nanofabrication

1999 ◽  
Vol 10 (1) ◽  
pp. 34-38 ◽  
Author(s):  
M Calleja ◽  
J Anguita ◽  
R Garcia ◽  
K Birkelund ◽  
F Pérez-Murano ◽  
...  
Keyword(s):  
Silicon Surfaces ◽  
Dynamic Force ◽  
Force Microscopy
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