Room temperature operated single electron transistor made by a scanning tunnelling microscopy/atomic force microscopy nano-oxidation process

1999 ◽  
Vol 86 (5) ◽  
pp. 641-662 ◽  
Author(s):  
KAZUHIKO MATSUMOTO
Keyword(s):  
Atomic Force Microscopy ◽  
Room Temperature ◽  
Oxidation Process ◽  
Scanning Tunnelling Microscopy ◽  
Single Electron ◽  
Single Electron Transistor ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scanning Tunnelling ◽  
Tunnelling Microscopy

Experimental and Simulated Results of Room Temperature Single Electron Transistor Formed by Atomic Force Microscopy Nano-Oxidation Process

2000 ◽  
Vol 39 (Part 1, No. 4B) ◽  
pp. 2334-2337 ◽  
Author(s):  
Yoshitaka Gotoh ◽  
Kazuhiko Matsumoto ◽  
Vladimir Bubanja ◽  
Francisco Vazquez ◽  
Tatsuro Maeda ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Room Temperature ◽  
Oxidation Process ◽  
Single Electron ◽  
Single Electron Transistor ◽  
Force Microscopy ◽  
Atomic Force

Atomic force microscopy and scanning tunnelling microscopy: Refining techniques for studying biomolecules

1994 ◽  
Vol 12 (4) ◽  
pp. 127-132 ◽  
Author(s):  
Clive J. Roberts ◽  
Philip M. Williams ◽  
Martyn C. Davies ◽  
David E. Jackson ◽  
Saul J.B. Tendler
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Tunnelling Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scanning Tunnelling ◽  
Tunnelling Microscopy
Sign in / Sign up

Export Citation Format

Share Document