Room-temperature single-electron memory made by pulse-mode atomic force microscopy nano oxidation process on atomically flat α-alumina substrate

2000 ◽  
Vol 76 (2) ◽  
pp. 239-241 ◽  
Author(s):  
Kazuhiko Matsumoto ◽  
Yoshitaka Gotoh ◽  
Tatsuro Maeda ◽  
John A. Dagata ◽  
James S. Harris
Keyword(s):  
Atomic Force Microscopy ◽  
Room Temperature ◽  
Oxidation Process ◽  
Pulse Mode ◽  
Alumina Substrate ◽  
Single Electron ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomically Flat ◽  
Mode Atomic Force Microscopy

Experimental and Simulated Results of Room Temperature Single Electron Transistor Formed by Atomic Force Microscopy Nano-Oxidation Process

2000 ◽  
Vol 39 (Part 1, No. 4B) ◽  
pp. 2334-2337 ◽  
Author(s):  
Yoshitaka Gotoh ◽  
Kazuhiko Matsumoto ◽  
Vladimir Bubanja ◽  
Francisco Vazquez ◽  
Tatsuro Maeda ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Room Temperature ◽  
Oxidation Process ◽  
Single Electron ◽  
Single Electron Transistor ◽  
Force Microscopy ◽  
Atomic Force
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