A digital control system for scanning tunnelling microscopy and atomic force microscopy

Measurement Science and Technology ◽

10.1088/0957-0233/4/3/004 ◽

1993 ◽

Vol 4 (3) ◽

pp. 270-280 ◽

Author(s):

T M H Wong ◽

M E Welland

Keyword(s):

Atomic Force Microscopy ◽

Control System ◽

Digital Control ◽

Scanning Tunnelling Microscopy ◽

Digital Control System ◽

Force Microscopy ◽

Atomic Force ◽

Scanning Tunnelling ◽

Tunnelling Microscopy

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Initial stages of localised corrosion by pitting of passivated nickel surfaces studied by scanning tunnelling microscopy (STM) and atomic force microscopy (AFM)

Local Probe Techniques for Corrosion Research ◽

10.1533/9781845692599.71 ◽

2007 ◽

pp. 71-83 ◽

Author(s):

V. Maurice ◽

T. Nakamura ◽

L. Klein ◽

P. Marcus

Keyword(s):

Atomic Force Microscopy ◽

Scanning Tunnelling Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Scanning Tunnelling ◽

Tunnelling Microscopy

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Polarization contrast in photon scanning tunnelling microscopy combined with atomic force microscopy

Journal of Microscopy ◽

10.1111/j.1365-2818.1995.tb03672.x ◽

1995 ◽

Vol 180 (2) ◽

pp. 165-173 ◽

Author(s):

K. PROPSTRA ◽

N. F. HULST

Keyword(s):

Atomic Force Microscopy ◽

Scanning Tunnelling Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Scanning Tunnelling ◽

Tunnelling Microscopy ◽

Polarization Contrast

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Development of molecular patterning and immobilization techniques for scanning tunnelling microscopy and atomic force microscopy

Nanotechnology ◽

10.1088/0957-4484/2/3/008 ◽

1991 ◽

Vol 2 (3) ◽

pp. 160-163 ◽

Author(s):

P Connolly ◽

J Cooper ◽

G R Moores ◽

Jie Shen ◽

G Thompson

Keyword(s):

Atomic Force Microscopy ◽

Scanning Tunnelling Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Molecular Patterning ◽

Scanning Tunnelling ◽

Tunnelling Microscopy ◽

Immobilization Techniques

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Atomic force microscopy and scanning tunnelling microscopy: Refining techniques for studying biomolecules

Trends in Biotechnology ◽

10.1016/0167-7799(94)90090-6 ◽

1994 ◽

Vol 12 (4) ◽

pp. 127-132 ◽

Author(s):

Clive J. Roberts ◽

Philip M. Williams ◽

Martyn C. Davies ◽

David E. Jackson ◽

Saul J.B. Tendler

Keyword(s):

Atomic Force Microscopy ◽

Scanning Tunnelling Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Scanning Tunnelling ◽

Tunnelling Microscopy

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Different Response of Atomic Force Microscopy and Scanning Tunnelling Microscopy to Charge Density Waves

EPL (Europhysics Letters) ◽

10.1209/0295-5075/9/7/014 ◽

1989 ◽

Vol 9 (7) ◽

pp. 695-700 ◽

Author(s):

E Meyer ◽

D Anselmetti ◽

R Wiesendanger ◽

H.-J Güntherodt ◽

F Lévy ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Charge Density ◽

Charge Density Waves ◽

Scanning Tunnelling Microscopy ◽

Density Waves ◽

Force Microscopy ◽

Atomic Force ◽

Scanning Tunnelling ◽

Tunnelling Microscopy ◽

Different Response

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Room temperature operated single electron transistor made by a scanning tunnelling microscopy/atomic force microscopy nano-oxidation process

International Journal of Electronics ◽

10.1080/002072199133292 ◽

1999 ◽

Vol 86 (5) ◽

pp. 641-662 ◽

Author(s):

KAZUHIKO MATSUMOTO

Keyword(s):

Atomic Force Microscopy ◽

Room Temperature ◽

Oxidation Process ◽

Scanning Tunnelling Microscopy ◽

Single Electron ◽

Single Electron Transistor ◽

Force Microscopy ◽

Atomic Force ◽

Scanning Tunnelling ◽

Tunnelling Microscopy

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Stripe and Criss-Cross Patterns in High-TcSuperconductors Revealed by Atomic Force Microscopy and Scanning Tunnelling Microscopy

Japanese Journal of Applied Physics ◽

10.1143/jjap.45.2259 ◽

2006 ◽

Vol 45 (3B) ◽

pp. 2259-2263 ◽

Author(s):

Michael R. Koblischka ◽

Marc Winter ◽

Anming Hu ◽

Masato Murakami ◽

Uwe Hartmann

Keyword(s):

Atomic Force Microscopy ◽

Scanning Tunnelling Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Scanning Tunnelling ◽

Tunnelling Microscopy

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All digital control system for a novel high frequency force sensor in non contact atomic force microscopy

2012 IEEE Sensors ◽

10.1109/icsens.2012.6411039 ◽

2012 ◽

Author(s):

J. Bouloc ◽

L. Nony ◽

C. Loppacher ◽

W. Rahajandraibe ◽

F. Bocquet ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Control System ◽

High Frequency ◽

Digital Control ◽

Force Sensor ◽

Digital Control System ◽

Force Microscopy ◽

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APPLICATION OF SCANNING TUNNELLING MICROSCOPY [STM] & ATOMIC FORCE MICROSCOPY [AFH] IN COLLOID & SURFACE CHEMISTRY (NANOTECHNOLOGY)

Journal of Dispersion Science and Technology ◽

10.1080/01932699908943821 ◽

1999 ◽

Vol 20 (1-2) ◽

pp. 795-837

Author(s):

K.S. Birdi

Keyword(s):

Atomic Force Microscopy ◽

Surface Chemistry ◽

Scanning Tunnelling Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Scanning Tunnelling ◽

Tunnelling Microscopy

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High-performance digital control system for scanning tunnelling microscopy

Measurement Science and Technology ◽

10.1088/0957-0233/13/10/313 ◽

2002 ◽

Vol 13 (10) ◽

pp. 1599-1607 ◽

Author(s):

Alex Boudreau ◽

Bruno Paillard ◽

Paul Rowntree

Keyword(s):

Control System ◽

Digital Control ◽

High Performance ◽

Scanning Tunnelling Microscopy ◽

Digital Control System ◽

Scanning Tunnelling ◽

Tunnelling Microscopy

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