Measurement of foil thickness and extinction distance by convergent beam transmission electron microscopy

1985 ◽  
Vol 52 (3) ◽  
pp. 289-303 ◽  
Author(s):  
F. R. Castro-fernandez ◽  
C. M. Sellars ◽  
J. A. Whiteman
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Foil Thickness ◽  
Transmission Electron ◽  
Beam Transmission ◽  
Convergent Beam

Theory and Errors in Stereo Electron Microscopy

1968 ◽  
Vol 26 ◽  
pp. 336-337
Author(s):  
J. M. Pankratz
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Plane Wave ◽  
Focal Length ◽  
Foil Thickness ◽  
Points Of Interest ◽  
Transmission Electron ◽  
Vertical Spacing ◽  
Illuminating System

It is often desirable in transmission electron microscopy to know the vertical spacing of points of interest within a specimen. However, in order to measure a stereo effect, one must have two pictures of the same area taken from different angles, and one must have also a formula for converting measured differences between corresponding points (parallax) into a height differential.Assume (a) that the impinging beam of electrons can be considered as a plane wave and (b) that the magnification is the same at the top and bottom of the specimen. The first assumption is good when the illuminating system is overfocused. The second assumption (the so-called “perspective error”) is good when the focal length is large (3 x 107Å) in relation to foil thickness (∼103 Å).

Optimal Sample Preparation to Characterize Corrosion in Historical Photographs with Analytical TEM

2014 ◽  
Vol 20 (5) ◽  
pp. 1585-1590
Author(s):  
Eva Grieten ◽  
Joost Caen ◽  
Dominique Schryvers
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Metallic Nanoparticles ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Soft Matrix ◽  
Transmission Electron ◽  
Traditional Preparation ◽  
Beam Transmission ◽  
Historical Photographs

AbstractAn alternative focused ion beam preparation method is used for sampling historical photographs containing metallic nanoparticles in a polymer matrix. We use the preparation steps of classical ultra-microtomy with an alternative final sectioning with a focused ion beam. Transmission electron microscopy techniques show that the lamella has a uniform thickness, which is an important factor for analytical transmission electron microscopy. Furthermore, the method maintains the spatial distribution of nanoparticles in the soft matrix. The results are compared with traditional preparation techniques such as ultra-microtomy and classical focused ion beam milling.

Characterization Of APB's In GaP

1996 ◽  
Vol 442 ◽  
Author(s):  
Dov Cohen ◽  
C. Barry Carter
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
Convergent Beam Electron Diffraction ◽  
Antiphase Boundaries ◽  
Beam Electron ◽  
Transmission Electron ◽  
Convergent Beam ◽  
Crystallographic Orientations

AbstractAntiphase boundaries in GaP crystals epitactically grown on Si (001) have been characterized using transmission electron microscopy. Convergent-beam electron diffraction was used to identify the antiphase-related grains. The antiphase boundaries were observed to adopt facets parallel to specific crystallographic orientations. Furthermore, stacking-fault-like contrast was observed along the interface suggesting that the domains may be offset from one another by a rigid-body lattice translation.

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