Determination of the C70/C60 ratio in fullerene thin film as a function of the sublimation distance and the substrate temperature using scanning tunnelling microscopy
1994 ◽
Vol 70
(3)
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pp. 721-730
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2002 ◽
Vol 4
(5)
◽
pp. S140-S144
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Keyword(s):
1991 ◽
Vol 4
(3-4)
◽
pp. 401-406
◽
2003 ◽
Vol 542
(3)
◽
pp. L655-L661
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Keyword(s):