Determination of the C70/C60 ratio in fullerene thin film as a function of the sublimation distance and the substrate temperature using scanning tunnelling microscopy

1994 ◽  
Vol 70 (3) ◽  
pp. 721-730 ◽  
Author(s):  
H. P. Lang ◽  
K. M. Heeger ◽  
V. Thommen-geiser ◽  
H.-J. Güntherodt
1990 ◽  
Vol 188 (2) ◽  
pp. 329-333 ◽  
Author(s):  
A.M. Troyanovskij ◽  
M. Hietschold ◽  
M.S. Khaikin ◽  
I. Androsch ◽  
W. Vollmann ◽  
...  

2014 ◽  
Vol 50 (65) ◽  
pp. 9034-9048 ◽  
Author(s):  
H. Marbach ◽  
H.-P. Steinrück

Scanning tunnelling microscopy of the dynamics of functional molecules (porphyrins) close to room temperature enables a detailed determination of the thermodynamic potentials including entropic contributions of the underlying processes.


2001 ◽  
Vol 707 ◽  
Author(s):  
Armando Rastelli ◽  
Matthias Kummer ◽  
Hans Von Känel

ABSTRACTCoherently strained Ge islands were grown at a substrate temperature of 550°C by magnetron sputter epitaxy on Si (001) and studied by scanning tunnelling microscopy (STM). The shape changes induced by exposure to a Si-flux at 450°C were investigated as a function of the Si-coverage. During Si-capping, multifaceted domes were found to flatten and to transform into {105}-faceted pyramids and subsequently into stepped mounds through intermediate shapes. The observed sequence of morphological changes is induced by Si-Ge intermixing and is shown to be the inverse of that occurring during Ge or Si1-xGex growth on Si (001). The results are interpreted with a model in which the stable shape of an island mainly depends on its volume and composition.


Nature ◽  
1985 ◽  
Vol 315 (6016) ◽  
pp. 253-254 ◽  
Author(s):  
A. M. Baró ◽  
R. Miranda ◽  
J. Alamán ◽  
N. García ◽  
G. Binnig ◽  
...  

2001 ◽  
Vol 696 ◽  
Author(s):  
Armando Rastelli ◽  
Matthias Kummer ◽  
Hans von Känel

AbstractCoherently strained Ge islands were grown at a substrate temperature of 550°C by magnetron sputter epitaxy on Si (001) and studied by scanning tunnelling microscopy (STM). The shape changes induced by exposure to a Si-flux at 450°C were investigated as a function of the Sicoverage. During Si-capping, multifaceted domes were found to flatten and to transform into {105}-faceted pyramids and subsequently into stepped mounds through intermediate shapes. The observed sequence of morphological changes is induced by Si-Ge intermixing and is shown to be the inverse of that occurring during Ge or Si1-xGex growth on Si (001). The results are interpreted with a model in which the stable shape of an island mainly depends on its volume and composition.


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