Atomic Force Microscopy, Transmission Electron Microscopy, and Photon Correlation Spectroscopy: Three Techniques for Rapid Characterization of Optimized Self-Nanoemulsiying Drug Delivery System of Glibenclamide, Carvedilol, and Lovastatin

2011 ◽  
Vol 32 (4) ◽  
pp. 538-545 ◽  
Author(s):  
Sandeep Kumar Singh ◽  
Priya Ranjan Prasad Verma ◽  
Balkishen Razdan
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Photon Correlation Spectroscopy ◽  
Correlation Spectroscopy ◽  
Photon Correlation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Rapid Characterization

Structural Characterization of Nc-Si/A-Sio2 Superlattices Subjected To Thermal Treatment

1998 ◽  
Vol 536 ◽  
Author(s):  
G. F. Grom ◽  
L. Tsybeskov ◽  
K. D. Hirschman ◽  
P. M. Fauchet ◽  
J. P. McCaffrey ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Raman Spectroscopy ◽  
Defect Density ◽  
High Temperature Annealing ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Si Nanocrystals

AbstractThe morphology of nanocrystalline (nc)-Si/amorphous (a)-SiO2 superlattices (SLs) is studied using Raman spectroscopy in the acoustic and optical phonon ranges, transmission electron microscopy (TEM), and atomic force microscopy (AFM). It is demonstrated that high temperature annealing (up to 1100°C) and oxidation in O2/H2O ambient do not destroy the SL structure, which retains its original periodicity and nc-Si/a-SiO2 interface abruptness. It is found that oxidation at high temperatures reduces the defect density in nc-Si/a-SiO2 SLs and induces the lateral coalescence of Si nanocrystals (NCs). The size, shape, packing density, and crystallographic orientation of the Si nanocrystals are studied as a function of the oxidation time.

Characterization of Geoinspired and Synthetic Chrysotile Nanotubes by Atomic Force Microscopy and Transmission Electron Microscopy

2007 ◽  
Vol 17 (16) ◽  
pp. 3332-3338 ◽  
Author(s):  
S. Piperno ◽  
I. Kaplan-Ashiri ◽  
S. R. Cohen ◽  
R. Popovitz-Biro ◽  
H. D. Wagner ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron
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