Defects Identification, Localization, and Classification Approaches: A Review

IETE Journal of Research ◽

10.1080/03772063.2021.1958073 ◽

2021 ◽

pp. 1-14

Author(s):

Md. Khwaja Muinuddin Chisti ◽

S. Srinivas Kumar ◽

Gandikota Prasad

Keyword(s):

Defects Identification

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Near-Surface Defects Identification in water immersion ultrasonic testing based on FFT and Phase Spectrum Difference

2020 IEEE Far East NDT New Technology & Application Forum (FENDT) ◽

10.1109/fendt50467.2020.9337546 ◽

2020 ◽

Author(s):

Shan-Yue Guan ◽

Li Li ◽

Xiao-Kai Wang

Keyword(s):

Ultrasonic Testing ◽

Surface Defects ◽

Water Immersion ◽

Phase Spectrum ◽

Near Surface ◽

Defects Identification

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Transesophageal Echocardiography During Repair of Congenital Cardiac Defects: Identification of Residual Problems Necessitating Reoperation

Journal of the American Society of Echocardiography ◽

10.1016/s0894-7317(14)80234-4 ◽

1993 ◽

Vol 6 (4) ◽

pp. 356-365 ◽

Author(s):

J. Geoffrey Stevenson ◽

Gregory K. Sorensen ◽

David M. Gartman ◽

Dale G. Hall ◽

Edward A. Rittenhouse

Keyword(s):

Transesophageal Echocardiography ◽

Cardiac Defects ◽

Congenital Cardiac Defects ◽

Defects Identification

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A Temperature Gradient-Based Potential Defects Identification Method for IGBT Module

IEEE Transactions on Power Electronics ◽

10.1109/tpel.2016.2565701 ◽

2017 ◽

Vol 32 (3) ◽

pp. 2227-2242 ◽

Author(s):

Bing Gao ◽

Fan Yang ◽

Minyou Chen ◽

Li Ran ◽

Irfan Ullah ◽

...

Keyword(s):

Temperature Gradient ◽

Identification Method ◽

Igbt Module ◽

Gradient Based ◽

Defects Identification

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Glass Defects Identification Using a Mass Spectrometer, Sem-Edx Microanalysis and HTO Analysis

78th Conference on Glass Problems - Ceramic Engineering and Science Proceedings ◽

10.1002/9781119519713.ch2 ◽

2018 ◽

pp. 13-27

Author(s):

Martina Jezikova ◽

Filip Janos ◽

Jiri Ullrich ◽

Erik Muijsenberg

Keyword(s):

Mass Spectrometer ◽

Defects Identification ◽

Edx Microanalysis

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Defects Identification in Textile by Means of Artificial Neural Networks

Advanced Intelligent Computing Theories and Applications. With Aspects of Artificial Intelligence - Lecture Notes in Computer Science ◽

10.1007/978-3-540-85984-0_140 ◽

2008 ◽

pp. 1166-1174 ◽

Author(s):

Vitoantonio Bevilacqua ◽

Lucia Cariello ◽

Giuseppe Mastronardi ◽

Vito Palmieri ◽

Marco Giannini

Keyword(s):

Neural Networks ◽

Artificial Neural Networks ◽

Artificial Neural ◽

Defects Identification

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Defects Identification by SVM-DS Fusion Decision-making with Multiple Features

Journal of Mechanical Engineering ◽

10.3901/jme.2010.16.101 ◽

2010 ◽

Vol 46 (16) ◽

pp. 101 ◽

Author(s):

Hongkun CHE

Keyword(s):

Decision Making ◽

Multiple Features ◽

Defects Identification

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Pulse voltammetry wine defects identification by means of miniaturized microelectrodes

10.1117/12.722070 ◽

2007 ◽

Author(s):

L. Francioso ◽

R. Bjorklund ◽

P. Siciliano ◽

T. K. Rulcker

Keyword(s):

Pulse Voltammetry ◽

Defects Identification

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Massive multi-frequency excitation and spectrogram eddy current method for defects identification in clad materials

2016 IEEE Far East NDT New Technology & Application Forum (FENDT) ◽

10.1109/fendt.2016.7992009 ◽

2016 ◽

Author(s):

Tomasz Chady ◽

Ryszard Sikora

Keyword(s):

Eddy Current ◽

Current Method ◽

Eddy Current Method ◽

Frequency Excitation ◽

Defects Identification

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Dopant delineation: novel technique for silicon dopant implantation defects identification

Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) ◽

10.1109/ipfa.2002.1025640 ◽

2003 ◽

Author(s):

Ng Sea Chooi ◽

Ng Jou Ching

Keyword(s):

Novel Technique ◽

Defects Identification

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Notice of Retraction: Defects Identification in a TSV Daisy-Chain Structure by a Machine Learning Approach

IEEE Transactions on Electromagnetic Compatibility ◽

10.1109/temc.2017.2787769 ◽

2018 ◽

Vol 60 (6) ◽

pp. 1932-1938

Author(s):

Stefano Piersanti ◽

Antonio Orlandi

Keyword(s):

Machine Learning ◽

Chain Structure ◽

Learning Approach ◽

Machine Learning Approach ◽

Defects Identification

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