Poling behaviour at the grain boundaries of ferroelectric PZT thin films investigated by electric scanning force microscopy

1997 ◽  
Vol 23 (1-2) ◽  
pp. 1-6 ◽  
Author(s):  
K. Franke ◽  
H. Huelz ◽  
S. Seifert
Keyword(s):  
Thin Films ◽  
Grain Boundaries ◽  
Scanning Force Microscopy ◽  
Pzt Thin Films ◽  
Force Microscopy ◽  
Scanning Force

Origin of surface potential change during ferroelectric switching in epitaxial PbTiO3 thin films studied by scanning force microscopy

2009 ◽  
Vol 94 (3) ◽  
pp. 032907 ◽  
Author(s):  
Yunseok Kim ◽  
Changdeuck Bae ◽  
Kyunghee Ryu ◽  
Hyoungsoo Ko ◽  
Yong Kwan Kim ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Potential ◽  
Scanning Force Microscopy ◽  
Potential Change ◽  
Force Microscopy ◽  
Scanning Force ◽  
Ferroelectric Switching

scholarly journals Nanostructuring and Hardness Investigations of Thin Films by Scanning Force Microscopy

1998 ◽  
Vol 93 (2) ◽  
pp. 437-441
Author(s):  
M. Nowicki ◽  
A. Richter ◽  
R. Ries ◽  
M. Oszwałdowski
Keyword(s):  
Thin Films ◽  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Scanning Force

scholarly journals Tribology studies of organic thin films by scanning force microscopy

1996 ◽  
Author(s):  
G. Bar ◽  
S. Rubin ◽  
A.N. Parikh ◽  
B.I. Swanson ◽  
T.A. Zawodzinski
Keyword(s):  
Thin Films ◽  
Organic Thin Films ◽  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Scanning Force
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