Local Piezoelectric Response in Bismuth-Based Ferroelectric Thin Films Investigated by Scanning Force Microscopy

2002 ◽  
Vol 41 (Part 2, No. 10A) ◽  
pp. L1103-L1105 ◽  
Author(s):  
Desheng Fu ◽  
Kazuyuki Suzuki ◽  
Kazumi Kato
2005 ◽  
Vol 97 (10) ◽  
pp. 104105 ◽  
Author(s):  
V. V. Shvartsman ◽  
N. A. Pertsev ◽  
J. M. Herrero ◽  
C. Zaldo ◽  
A. L. Kholkin

1997 ◽  
Vol 493 ◽  
Author(s):  
A. Gruverman ◽  
S. A. Prakash ◽  
S. Aggarwal ◽  
R. Ramesh ◽  
O. Auciello ◽  
...  

ABSTRACTScanning force microscopy (SFM) was applied to direct nanoscale investigation of the mechanism of retention loss in ferroelectric thin films. Experiments were conducted by performing local polarization reversal within an individual grain with subsequent imaging of a resulting domain structure at various time intervals. A conductive SFM tip was used for domain switching and imaging in the SFM piezoresponse mode.


2001 ◽  
Vol 78 (18) ◽  
pp. 2751-2753 ◽  
Author(s):  
A. Gruverman ◽  
A. Kholkin ◽  
A. Kingon ◽  
H. Tokumoto

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