Piezoresponse scanning force microscopy: What quantitative information can we really get out of piezoresponse measurements on ferroelectric thin films

2001 ◽  
Vol 38 (1-4) ◽  
pp. 23-29 ◽  
Author(s):  
Catalin Harnagea ◽  
Alain Pignolet ◽  
Marin Alexe ◽  
Dietrich Hesse
2005 ◽  
Vol 97 (10) ◽  
pp. 104105 ◽  
Author(s):  
V. V. Shvartsman ◽  
N. A. Pertsev ◽  
J. M. Herrero ◽  
C. Zaldo ◽  
A. L. Kholkin

1997 ◽  
Vol 493 ◽  
Author(s):  
A. Gruverman ◽  
S. A. Prakash ◽  
S. Aggarwal ◽  
R. Ramesh ◽  
O. Auciello ◽  
...  

ABSTRACTScanning force microscopy (SFM) was applied to direct nanoscale investigation of the mechanism of retention loss in ferroelectric thin films. Experiments were conducted by performing local polarization reversal within an individual grain with subsequent imaging of a resulting domain structure at various time intervals. A conductive SFM tip was used for domain switching and imaging in the SFM piezoresponse mode.


2001 ◽  
Vol 78 (18) ◽  
pp. 2751-2753 ◽  
Author(s):  
A. Gruverman ◽  
A. Kholkin ◽  
A. Kingon ◽  
H. Tokumoto

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