IN SITU INVESTIGATION OF RETENTION PROPERTIES OF POLYDOMAIN FERROELECTRIC THIN FILMS BY MULTIMODE SCANNING FORCE MICROSCOPY

2008 ◽  
Vol 98 (1) ◽  
pp. 26-34 ◽  
Author(s):  
Longhai Wang ◽  
Jun Yu ◽  
Zhihong Wang ◽  
Huizhong Zeng ◽  
Yunbo Wang ◽  
...  
Keyword(s):  
Thin Films ◽  
Scanning Force Microscopy ◽  
Ferroelectric Thin Films ◽  
Force Microscopy ◽  
In Situ Investigation ◽  
Scanning Force

Nonlinear local piezoelectric deformation in ferroelectric thin films studied by scanning force microscopy

2005 ◽  
Vol 97 (10) ◽  
pp. 104105 ◽  
Author(s):  
V. V. Shvartsman ◽  
N. A. Pertsev ◽  
J. M. Herrero ◽  
C. Zaldo ◽  
A. L. Kholkin
Keyword(s):  
Thin Films ◽  
Scanning Force Microscopy ◽  
Ferroelectric Thin Films ◽  
Force Microscopy ◽  
Scanning Force

scholarly journals Pathways of cylindrical orientations in PS-b-P4VP diblock copolymer thin films upon solvent vapor annealing

Soft Matter ◽  
2014 ◽  
Vol 10 (39) ◽  
pp. 7753-7761 ◽  
Author(s):  
E. Bhoje Gowd ◽  
Tadanori Koga ◽  
Maya K. Endoh ◽  
Kamlesh Kumar ◽  
Manfred Stamm
Keyword(s):  
Thin Films ◽  
Scanning Force Microscopy ◽  
Ex Situ ◽  
Time Resolved ◽  
Solvent Vapor ◽  
Force Microscopy ◽  
Vapor Annealing ◽  
Scanning Force ◽  
Solvent Vapor Annealing

Pathways that control the orientations of cylindrical microdomains formed in PS-b-P4VP thin films upon annealing in different solvent vapors were clarified using time-resolved in situ GISAXS and ex situ scanning force microscopy.

scholarly journals Nanoscale Investigation of Polarization Retention Loss in Ferroelectric Thin Films VIA Scanning Force Microscopy

1997 ◽  
Vol 493 ◽  
Author(s):  
A. Gruverman ◽  
S. A. Prakash ◽  
S. Aggarwal ◽  
R. Ramesh ◽  
O. Auciello ◽  
...  
Keyword(s):  
Thin Films ◽  
Domain Switching ◽  
Scanning Force Microscopy ◽  
Ferroelectric Thin Films ◽  
Time Intervals ◽  
Force Microscopy ◽  
Retention Loss ◽  
Scanning Force ◽  
Local Polarization ◽  
Polarization Retention

ABSTRACTScanning force microscopy (SFM) was applied to direct nanoscale investigation of the mechanism of retention loss in ferroelectric thin films. Experiments were conducted by performing local polarization reversal within an individual grain with subsequent imaging of a resulting domain structure at various time intervals. A conductive SFM tip was used for domain switching and imaging in the SFM piezoresponse mode.

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