Screening effect on ⟨110⟩ high-resolution electron microscopy image of compound semiconductors

1991 ◽  
Vol 63 (5) ◽  
pp. 1087-1100 ◽  
Author(s):  
K. Hiratsuka
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Compound Semiconductors ◽  
High Resolution Electron Microscopy ◽  
Screening Effect ◽  
Electron Microscopy Image ◽  
Resolution Electron ◽  
Microscopy Image

Structural relation between a 2D fivefold quasicrystal and crystalline approximants in an Al–Co–Ni–Tb alloy

1996 ◽  
Vol 11 (8) ◽  
pp. 1891-1896 ◽  
Author(s):  
X. Z. Li ◽  
K. Hiraga
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
High Resolution Electron Microscopy ◽  
Two Dimensional ◽  
Large Unit ◽  
Atom Cluster ◽  
Aperiodic Tiling ◽  
Resolution Electron ◽  
Microscopy Image ◽  
Large Unit Cell

A two-dimensional quasicrystal with fivefold symmetry and two large-unit-cell crystalline approximants in an Al–Co–Ni–Tb alloy, which were observed in previous studies, are suggested to be composed of the same kind of atom cluster. Some characteristics of the atom cluster can be deduced from a high-resolution electron microscopy image of the Al–Co–Ni–Tb quasicrystal when the image is associated with a fivefold aperiodic tiling. By using the cut-and-projection method, a quasiperiodic tiling generated by an irrational projection is proposed as an ideal quasilattice of the Al–Co–Ni–Tb quasicrystal; in the meantime, periodic tilings generated by a rational projection present the lattices of the crystalline approximants.

Cubic silicon nitride embedded in amorphous silicon dioxide

2001 ◽  
Vol 16 (8) ◽  
pp. 2179-2181
Author(s):  
Ming Zhang ◽  
Hongliang He ◽  
F. F. Xu ◽  
T. Sekine ◽  
T. Kobayashi ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Silicon Nitride ◽  
High Resolution ◽  
Analytical Electron Microscopy ◽  
High Resolution Electron Microscopy ◽  
Cubic Symmetry ◽  
Resolution Electron ◽  
Microscopy Image ◽  
Wave Compression ◽  
Small Crystallite

A cubic silicon nitride embedded in amorphous SiO2 compound has been characterized by means of high-resolution analytical electron microscopy. The specimen was prepared from β–Si3N4 powders at a high pressure and temperature by shock wave compression. The typical high-resolution electron microscopy image from one small crystallite together with its diffractodiagram pattern indicated that the Si3N4 crystallites had a cubic symmetry. The electron energy loss spectrum from the small crystallite is very different from those of outside amorphous SiO2 phase and raw β–Si3N4 particles, and there are more N elements that were detected in this small crystallite than those in standard Si3N4.

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