On the energy-loss spectrum of fast electrons after plural inelastic scattering

In electron diffraction the study of inelastic scattering processes has been revolutionised with the development of imaging PEELS. It is now relatively straightforward to produce images from fast electrons which have lost a specific amount of energy (to within about 5eV). Therefore electrons which have been inelastically scattered via an atomic transition, loosing a characteristic amount of energy, can in principle be used to form an equally characteristic image. It should be noted that such images will not be perfect since other single and multiple inelastic events may result in a similar energy loss which will tend to obscure the ideal picture. An important issue is the ultimate resolution limit of this type of atomic imaging. Although practical questions (such as signal-to-noise ratio) are important it is still interesting to ask what theoretical limit might be imposed by the underlying physics of the inelastic scattering and imaging processes. The work presented here is an initial investigation of the typical radial size and shape which can be expected when imaging a single atom and how these depend upon the transition and energy loss being considered.

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Phonon effects in energy loss spectra of fast electrons in metal films

Microelectronics Reliability ◽

10.1016/0026-2714(72)90218-1 ◽

1972 ◽

Vol 11 (3) ◽

pp. 247

Keyword(s):

Energy Loss ◽

Metal Films ◽

Fast Electrons

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Orientation dependence of core edges from anisotropic materials determined by inelastic scattering of fast electrons

Physical Review B ◽

10.1103/physrevb.28.2361 ◽

1983 ◽

Vol 28 (5) ◽

pp. 2361-2373 ◽

Cited By ~ 164

Author(s):

R. D. Leapman ◽

P. L. Fejes ◽

J. Silcox

Keyword(s):

Inelastic Scattering ◽

Anisotropic Materials ◽

Orientation Dependence ◽

Fast Electrons

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ICSC: a program for calculating inelastic scattering cross sections for fast electrons incident on crystals

Journal of Applied Crystallography ◽

10.1107/s0021889803002875 ◽

2003 ◽

Vol 36 (3) ◽

pp. 940-943 ◽

Cited By ~ 29

Author(s):

M. P. Oxley ◽

L. J. Allen

Keyword(s):

Inelastic Scattering ◽

Cross Sections ◽

Dark Field ◽

Fast Electrons ◽

Scattering Coefficients ◽

Einstein Model ◽

Annular Dark Field ◽

Inner Shell Ionization ◽

Scattering Cross Sections ◽

Shell Ionization

A computer program which calculates inner-shell ionization and backscattering cross sections for fast electrons incident on a crystal is presented. The program calculates the inelastic scattering coefficients for inner-shell ionization, pertinent to electron energy loss spectroscopy and energy dispersive X-ray analysis, using recently presented parameterizations of the atomic scattering factors. Orientation-dependent cross sections, suitable for atom location by channelling enhanced microanalysis, may be calculated. Inelastic scattering coefficients that allow the calculation of orientation-dependent annular dark-field and Rutherford backscattering maps are calculated using an Einstein model. In all cases, absorption due to thermal diffuse scattering, also calculated using an Einstein model, can be included.

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Le spectre des états électroniques de Kr I mesuré par spectrométrie électronique

Canadian Journal of Physics ◽

10.1139/p75-258 ◽

1975 ◽

Vol 53 (19) ◽

pp. 2079-2084 ◽

Cited By ~ 5

Author(s):

A. Delage ◽

J.-D. Carette

Keyword(s):

Experimental Data ◽

Energy Loss ◽

Inelastic Scattering ◽

Electronic States ◽

Resolving Power ◽

Electron Spectrometer ◽

Energy Incident ◽

First Time ◽

Electron Energy Loss ◽

Electron Energy Loss Spectra

The spectrum of electronic states of krypton I has been measured by inelastic scattering of monoenergetic electrons with the aid of an electron spectrometer which has a high resolving power, ΔE/E = 0.02. Electron energy loss spectra have allowed us to detect and identify numerous electronic states of krypton I for the first time by the means of this experimental method. The relative heights of the peaks corresponding to an energy loss, which are related to the probability of excitation of the atom by electron impact to a given state, have been measured from experimental data as a function of the energy incident electrons and as a function of the scattering angle.

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