Evaluation of crystallite size and microstrains in cold-worked lithium fluoride from X-ray diffraction line profiles

1969 ◽  
Vol 2 (1) ◽  
pp. 21-26 ◽  
Author(s):  
D Lewis ◽  
D O Northwood
Keyword(s):  
Crystallite Size ◽  
Lithium Fluoride ◽  
Diffraction Line ◽  
Line Profiles ◽  
X Ray Diffraction ◽  
X Ray ◽  
Cold Worked

Correction for errors in microstrain values from X-ray diffraction line profiles

1977 ◽  
Vol 36 (5) ◽  
pp. 1261-1264 ◽  
Author(s):  
H. De Keijser ◽  
E. J. Mittemeijer
Keyword(s):  
Diffraction Line ◽  
Line Profiles ◽  
X Ray Diffraction ◽  
X Ray

Dislocations, crystallite size, and planar faults in nanocrystalline ceria

2009 ◽  
Vol 24 (3) ◽  
pp. 228-233 ◽  
Author(s):  
S. R. Aghdaee ◽  
V. Soleimanian
Keyword(s):  
Grain Size ◽  
Dislocation Density ◽  
Crystallite Size ◽  
Cerium Oxide ◽  
Diffraction Line ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray ◽  
Nanocrystalline Ceria ◽  
Hall Plot

The modified Williamson–Hall and Warren–Averbach methods were used successfully for analyzing experimentally observed anisotropic X-ray diffraction line broadening and for determining reliable values of crystallite size and dislocation density in cerium oxide. The modified Williamson–Hall plot gives 22.3(2) nm for volume-weighted crystallite size, while the modified Warren–Averbach produces 18.0(2) nm for area-weighted grain size. The dislocation density and effective outer cut-off radius of dislocations obtained from the modified Warren–Averbach method are 1.8(3)×1015 m−2 and 15.5(1) nm, respectively.

In-Situ Studies of X-Ray Diffraction Line Profiles from Strained Copper Foils

2001 ◽  
Vol 378-381 ◽  
pp. 254-261 ◽  
Author(s):  
Robert W. Cheary ◽  
C.C. Tang ◽  
P.A. Lynch ◽  
M.A. Roberts ◽  
S.M. Clark
Keyword(s):  
Diffraction Line ◽  
Line Profiles ◽  
X Ray Diffraction ◽  
X Ray ◽  
In Situ Studies ◽  
Copper Foils
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