Investigation of the effects of interface carrier concentration on ZnO thin film transistors fabricated by atomic layer deposition
2009 ◽
Vol 42
(23)
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pp. 235102
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2018 ◽
Vol 439
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pp. 632-637
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2013 ◽
Vol 14
(2)
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pp. 61-65
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2011 ◽
Vol 158
(2)
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pp. H170
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2020 ◽
Vol 67
(8)
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pp. 3129-3134
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2017 ◽
Vol 38
(10)
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pp. 1390-1393
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2014 ◽
Vol 35
(3)
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pp. 360-362
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2015 ◽
Vol 7
(40)
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pp. 22610-22617
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