Detection and evaluation of self-heating effects in n+nn+AlxGa1-xAs devices by noise temperature measurements
1995 ◽
Vol 10
(4)
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pp. 515-522
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2012 ◽
Vol 11
(1)
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pp. 106-117
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2017 ◽
Vol 64
(11)
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pp. 4393-4399
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2009 ◽
Vol 41
(9)
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pp. 1665-1668
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