SEM investigation of the critical current degradation onset in BSCCO-2223 multifilamentary tapes submitted to bending

ABSTRACTThe influence of lateral critical current density (Jc) distributions on AC transport losses in self-fields at 77 K have been investigated on the Ag-sheathed (Bi, Pb)-2223 multifilamentary tapes with different filament arrangements. The trapped magnetic field distributions in a remanent state on the tape surface measured by a scanning Hall sensor depend on the filament arrangements and gradually deviate from the calculation results of magnetic profile without any Jc variations in their cross sections. The transport loss values are strongly influenced from the filament arrangements in each tape, although the main contribution to the losses comes by the hysteresis loss in the superconductor. These results are explained by the calculation results of the shape of field-free core and flux-penetration-regions, varying with filament arrangements and local Jc distributions along a width direction.

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Fabrication, critical current density and A.C. losses of Bi2223 multifilamentary tapes with Sr-V-O barriers configured inside each filament

10.1063/1.1472609 ◽

2002 ◽

Author(s):

H. Maeda

Keyword(s):

Critical Current Density ◽

Critical Current ◽

Current Density ◽

Multifilamentary Tapes

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AC Losses and Critical Current Densities of NbTi/Cu Multifilamentary Tapes

IEEE Transactions on Applied Superconductivity ◽

10.1109/tasc.2007.899647 ◽

2007 ◽

Vol 17 (2) ◽

pp. 2546-2549 ◽

Cited By ~ 3

Author(s):

F.. Sumiyoshi ◽

A.. Kawagoe ◽

A.. Jikuzono ◽

T.. Mito ◽

N.. Yanagi ◽

...

Keyword(s):

Critical Current ◽

Ac Losses ◽

Current Densities ◽

Multifilamentary Tapes

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Critical current density of Bi-2223/Ag multifilamentary tapes from 4.2 K up to 90 K in magnetic fields up to 23 T

IEEE Transactions on Applied Superconductivity ◽

10.1109/77.785015 ◽

1999 ◽

Vol 9 (2) ◽

pp. 2585-2588 ◽

Cited By ~ 8

Author(s):

A.B. Sneary ◽

C.M. Friend ◽

J.C. Vallier ◽

D.P. Hampshire

Keyword(s):

Magnetic Fields ◽

Critical Current Density ◽

Critical Current ◽

Current Density ◽

Multifilamentary Tapes

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Microstructural characterization of YBa2Cu3O7-x thin films formed by metalorganic CVD

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100089718 ◽

1991 ◽

Vol 49 ◽

pp. 1080-1081

Author(s):

P. Lu ◽

W. Huang ◽

C.S. Chern ◽

Y.Q. Li ◽

J. Zhao ◽

...

Keyword(s):

Thin Film ◽

Thin Films ◽

Critical Current Density ◽

Critical Current ◽

Current Density ◽

Film Growth ◽

Chemical Vapor ◽

Microstructural Characterization ◽

Ion Milling ◽

Conventional Grinding

The YBa2Cu3O7-x thin films formed by metalorganic chemical vapor deposition(MOCVD) have been reported to have excellent superconducting properties including a sharp zero resistance transition temperature (Tc) of 89 K and a high critical current density of 2.3x106 A/cm2 or higher. The origin of the high critical current in the thin film compared to bulk materials is attributed to its structural properties such as orientation, grain boundaries and defects on the scale of the coherent length. In this report, we present microstructural aspects of the thin films deposited on the (100) LaAlO3 substrate, which process the highest critical current density.Details of the thin film growth process have been reported elsewhere. The thin films were examined in both planar and cross-section view by electron microscopy. TEM sample preparation was carried out using conventional grinding, dimpling and ion milling techniques. Special care was taken to avoid exposure of the thin films to water during the preparation processes.

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