Nanomechanics from atomic resolution to molecular recognition based on atomic force microscopy technology

2002 ◽  
Vol 13 (5) ◽  
pp. R29-R36 ◽  
Author(s):  
H P Lang ◽  
M Hegner ◽  
E Meyer ◽  
Ch Gerber
Keyword(s):  
Atomic Force Microscopy ◽  
Molecular Recognition ◽  
Atomic Resolution ◽  
Force Microscopy ◽  
Atomic Force

Visualization of molecular binding sites at the nanoscale in the lift-up mode by amplitude-modulation atomic force microscopy

Nanoscale ◽  
2021 ◽  
Vol 13 (7) ◽  
pp. 4213-4220
Author(s):  
Tatsuhiro Maekawa ◽  
Takashi Nyu ◽  
Evan Angelo Quimada Mondarte ◽  
Hiroyuki Tahara ◽  
Kasinan Suthiwanich ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Molecular Recognition ◽  
Amplitude Modulation ◽  
Binding Sites ◽  
Local Distribution ◽  
New Approach ◽  
Molecular Binding ◽  
Force Microscopy ◽  
Atomic Force ◽  
Recognition Sites

We report a new approach to visualize the local distribution of molecular recognition sites with nanoscale resolution by amplitude-modulation atomic force microscopy.

Atomic Resolution Imaging on Si(100)2×1 and Si(100)2×1:H Surfaces with Noncontact Atomic Force Microscopy

2000 ◽  
Vol 39 (Part 2, No. 2A) ◽  
pp. L113-L115 ◽  
Author(s):  
Kousuke Yokoyama ◽  
Taketoshi Ochi ◽  
Akira Yoshimoto ◽  
Yasuhiro Sugawara ◽  
Seizo Morita
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Resolution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resolution Imaging

scholarly journals High viscosity environments: an unexpected route to obtain true atomic resolution with atomic force microscopy

2014 ◽  
Vol 25 (17) ◽  
pp. 175701 ◽  
Author(s):  
Stefan A L Weber ◽  
Jason I Kilpatrick ◽  
Timothy M Brosnan ◽  
Suzanne P Jarvis ◽  
Brian J Rodriguez
Keyword(s):  
Atomic Force Microscopy ◽  
High Viscosity ◽  
Atomic Resolution ◽  
Force Microscopy ◽  
Atomic Force

True atomic resolution imaging with noncontact atomic force microscopy

1997 ◽  
Vol 113-114 ◽  
pp. 364-370 ◽  
Author(s):  
Yasuhiro Sugawara ◽  
Hitoshi Ueyama ◽  
Takayuki Uchihashi ◽  
Masahiro Ohta ◽  
Seizo Morita ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Resolution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resolution Imaging
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