Evidence of space charge regions within semiconductor nanowires from Kelvin probe force microscopy

Nanotechnology ◽

10.1088/0957-4484/20/46/465705 ◽

2009 ◽

Vol 20 (46) ◽

pp. 465705 ◽

Author(s):

Angela C Narváez ◽

Thalita Chiaramonte ◽

Klaus O Vicaro ◽

João H Clerici ◽

Mônica A Cotta

Keyword(s):

Space Charge ◽

Semiconductor Nanowires ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy

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Methodology for extraction of space charge density profiles at nanoscale from Kelvin probe force microscopy measurements

Nanotechnology ◽

10.1088/1361-6528/aa9839 ◽

2017 ◽

Vol 28 (50) ◽

pp. 505701 ◽

Author(s):

C Villeneuve-Faure ◽

L Boudou ◽

K Makasheva ◽

G Teyssedre

Keyword(s):

Charge Density ◽

Space Charge ◽

Space Charge Density ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Density Profiles ◽

Force Microscopy

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Identifying a doping type of semiconductor nanowires by photoassisted kelvin probe force microscopy as exemplified for GaN nanowires

Optical Materials Express ◽

10.1364/ome.7.000904 ◽

2017 ◽

Vol 7 (3) ◽

pp. 904 ◽

Author(s):

Xiaoxiao Sun ◽

Xinqiang Wang ◽

Ping Wang ◽

Bowen Sheng ◽

Mo Li ◽

...

Keyword(s):

Semiconductor Nanowires ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Gan Nanowires ◽

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Measurement of interface potential change and space charge region across metal/organic/metal structures using Kelvin probe force microscopy

Applied Physics Letters ◽

10.1063/1.1811805 ◽

2004 ◽

Vol 85 (18) ◽

pp. 4148-4150 ◽

Author(s):

O. Tal ◽

W. Gao ◽

C. K. Chan ◽

A. Kahn ◽

Y. Rosenwaks

Keyword(s):

Space Charge ◽

Space Charge Region ◽

Kelvin Probe Force Microscopy ◽

Potential Change ◽

Organic Metal ◽

Kelvin Probe ◽

Metal Structures ◽

Force Microscopy ◽

Metal Organic ◽

Interface Potential

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Space charge measurements with Kelvin probe force microscopy

IEEE Transactions on Dielectrics and Electrical Insulation ◽

10.1109/tdei.2017.006457 ◽

2017 ◽

Vol 24 (3) ◽

pp. 1913-1922 ◽

Author(s):

Kapil Faliya ◽

Herbert Kliem ◽

Carlos J. Dias

Keyword(s):

Space Charge ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy

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Imaging the Photocarrier Dynamics in Organic, Hybrid and Two-Dimensional Photovoltaic Materials by Time-Resolved Kelvin Probe Force Microscopy

10.29363/nanoge.fallmeeting.2018.014 ◽

2018 ◽

Author(s):

Benjamin GREVIN

Keyword(s):

Kelvin Probe Force Microscopy ◽

Two Dimensional ◽

Kelvin Probe ◽

Time Resolved ◽

Force Microscopy ◽

Organic Hybrid ◽

Photovoltaic Materials

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Direct observation of contact potential distributions of wafer-bonded p-GaAs/n-GaN and p-GaAs/n-Si by scanning Kelvin probe force microscopy

Japanese Journal of Applied Physics ◽

10.35848/1347-4065/abc02a ◽

2020 ◽

Vol 59 (11) ◽

pp. 115502

Author(s):

Zhiwei Xing ◽

Wenxian Yang ◽

Yukun Zhao ◽

Junhua Long ◽

Xuefei Li ◽

...

Keyword(s):

Direct Observation ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Contact Potential ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Energy-Level Alignment at Interfaces between Transition-Metal Dichalcogenide Monolayers and Metal Electrodes Studied with Kelvin Probe Force Microscopy

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.1c01612 ◽

2021 ◽

Author(s):

Pavel A. Markeev ◽

Emad Najafidehaghani ◽

Ziyang Gan ◽

Kai Sotthewes ◽

Antony George ◽

...

Keyword(s):

Transition Metal ◽

Energy Level ◽

Kelvin Probe Force Microscopy ◽

Transition Metal Dichalcogenide ◽

Kelvin Probe ◽

Metal Electrodes ◽

Force Microscopy ◽

Energy Level Alignment

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Real-space measurement of potential distribution in PECVD ONO electrets by Kelvin probe force microscopy

Nanotechnology ◽

10.1088/0957-4484/27/20/205703 ◽

2016 ◽

Vol 27 (20) ◽

pp. 205703 ◽

Author(s):

F Emmerich ◽

C Thielemann

Keyword(s):

Potential Distribution ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Space Measurement

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Surface photovoltage analysis of thin CdS layers on polycrystalline chalcopyrite absorber layers by Kelvin probe force microscopy

Nanotechnology ◽

10.1088/0957-4484/19/14/145705 ◽

2008 ◽

Vol 19 (14) ◽

pp. 145705 ◽

Author(s):

Th Glatzel ◽

M Rusu ◽

S Sadewasser ◽

M Ch Lux-Steiner

Keyword(s):

Kelvin Probe Force Microscopy ◽

Surface Photovoltage ◽

Kelvin Probe ◽

Force Microscopy

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Kelvin Probe Force Microscopy investigations of High Strength Metallurgical Graphene transferred on low-density polyethylene

Microelectronic Engineering ◽

10.1016/j.mee.2016.02.046 ◽

2016 ◽

Vol 157 ◽

pp. 71-77 ◽

Author(s):

Krzysztof Gajewski ◽

Witold Szymański ◽

Piotr Niedzielski ◽

Teodor Gotszalk

Keyword(s):

High Strength ◽

Kelvin Probe Force Microscopy ◽

Low Density Polyethylene ◽

Low Density ◽

Kelvin Probe ◽

Force Microscopy

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