Red emission analysis, Judd-Ofelt intensity parameters and laser properties of CdMgZnO: xEu3+ nanocrystals: Effect of Eu3+ concentration

Author(s):  
Onyekachi Kalu ◽  
Iorkyaa Ahemen ◽  
Hilda E Esparza-Ponce ◽  
Jose Alberto Duarte-Moller ◽  
A Reyes-Rojas
2021 ◽  
Vol 32 (19) ◽  
pp. 24415-24428
Author(s):  
M. N. Azlan ◽  
Y. Azlina ◽  
H. R. Shaari ◽  
S. N. Nazrin ◽  
Naif Mohammed Al-Hada ◽  
...  

2010 ◽  
Vol 123-125 ◽  
pp. 19-22
Author(s):  
B. Sudhakar Reddy ◽  
K. Vemasevana Raju ◽  
S. Sailaja ◽  
C. Nageswara Raju ◽  
D. Sreekantha Reddy

This paper reports on the development and the near infra-red emission(NIR) analysis of Er3+/Yb3+ and Er3+/ Tm3+ ions doped TeO2 - B2O3 – ZnO - Li2O glasses for tunable laser and optical fiber amplification. From the measured near infra-red emission spectra of Er3+/Yb3+, Er3+/Tm3+: ZLiBT glasses have revealed the prominent near infra-red emission bands at 1532 nm (4I13/2 → 4I15/2), with an excitation wavelength of λexci = 515 nm (Ar+ ion laser). The full width at half-maxima (FWHM) values are also estimated from the measured near infra-red emission spectra of the glasses. Based on spectral results, broad near infra-red emissions should have potential applications in broadly tunable laser sources and broad band optical amplification at low-loss telecommunication windows.


1994 ◽  
Vol 144 ◽  
pp. 597-599 ◽  
Author(s):  
I. V. Alexeyeva ◽  
N. L. Kroussanova ◽  
M. V. Streltsova

AbstractThe results of photometry of colour positives of the solar corona of July 11, 1991 are presented. Observations of the white corona were made without radial niters in Jojutla (Mexico). Dependences of coronal brightness on distance in the red (640 nm) and blue (420 nm) wavelength intervals are deduced for different coronal structures up to 3.0-3.5R⊙. The effect of ”reddening“ is noted. The excess of the red emission to the blue one (I640nm/I420nm) is found to be 1.20 and 1.17 at distance of 2.2R⊙for the N-E helmet streamer (P ≃ 37°) and the N-W region of low brightness (P ≃ 339°), respectively.


1988 ◽  
Vol 31 (3) ◽  
pp. 425-431 ◽  
Author(s):  
Stephen M. Camarata ◽  
Lisa Erwin

This paper presents a case study of a language-impaired child who signaled the distinction between English singular and plural using suprasegmental cues rather than the usual segmental form used within the parent language. Acoustic analyses performed within the first study in the paper revealed that the suprasegmental features used to maintain this distinction included various duration, fundamental frequency, and intensity parameters. Acoustic analyses Were also performed on a set of matched two- and four-item plural forms within a second study. The results of these analyses indicated that the same acoustic parameters were used to distinguish two-item plural forms from four-item plural forms. This case of linguistic creativity is offered as further evidence in support of the model of language acquisition that emphasizes the active role children take in the acquisition process. Additionally, the phonological, morphological, and psycholinguistic factors that may contribute to such rule invention are discussed.


2012 ◽  
Vol 53 (6) ◽  
pp. 1069-1074 ◽  
Author(s):  
Mitsuharu Shiwa ◽  
Hiroyuki Masuda ◽  
Hisashi Yamawaki ◽  
Kaita Ito ◽  
Manabu Enoki

2018 ◽  
Vol 84 (11) ◽  
pp. 9-14
Author(s):  
E. S. Koshel ◽  
V. B. Baranovskaya ◽  
M. S. Doronina

The analytical capabilities of arc atomic emission determination of As, Bi, Sb, Cu, Te in rare earth metals (REM) and their oxides after preparatory group concentration using S,N-containing heterochain polymer sorbent are studied on a high-resolution spectrometer “Grand- Extra” (“WMC-Optoelectron-ics” company, Russia). Sorption kinetics and dependence of the degree of the impurity extraction on the solution acidity are analyzed to specify conditions of sorption concentration. To optimize the procedure of arc atomic emission determination of As, Bi, Sb, Cu, and Te various schemes of their sorption preconcentration and subsequent processing of the resulted concentrate with the addition of a collector at different stages of the sorption process have been considered. Graphite powder is used as a collector in analysis of rare earth oxides due to universality and relative simplicity of the emission spectrum. Conditions of analysis and parameters of the spectrometer that affect the analytical signal (mass and composition of the sample, shape and size of the electrodes, current intensity and generator operation mode, interelectrode spacing, wavelengths of the analytical lines) are chosen. The evaporation curves of the determinable impurities were studied and the exposure time of As, Bi, Sb, Cu, and Te in the resulted sorption concentrate was determined. Correctness of the obtained results was evaluated using standard samples of the composition and in comparisons between methods. The results of the study are used to develop a method of arc chemical-atomic emission analysis of yttrium, gadolinium, neodymium, europium, scandium and their oxides in a concentration range of n x (10-2 - 10-5) wt.%.


Author(s):  
Mehrdad Mahanpour ◽  
Andy Gray ◽  
Jose Hulog ◽  
Pat Chang

Abstract C4 (Controlled Collapse Chip Connection) failure analysis compared to conventional packages (DIP- LCC- QFP, etc.) is not trivial. For instance, one has to thin the C4 die for IR microscope inspection or for photon emission analysis. Then, after failure analysis on the die, it must be removed for deprocessing or further analysis. Three methods and techniques will be discussed for removing the C4 die from the package without damaging the die. However, for each technique it is very important to know the condition of the die and package prior to die removal. The method used will differ, for example, if the die is thinned or not.


Author(s):  
S.-S. Lee ◽  
J.-S. Seo ◽  
N.-S. Cho ◽  
S. Daniel

Abstract Both photo- and thermal emission analysis techniques are used from the backside of the die colocate defect sites. The technique is important in that process and package technologies have made front-side analysis difficult or impossible. Several test cases are documented. Intensity attenuation through the bulk of the silicon does not compromise the usefulness of the technique in most cases.


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