scholarly journals Statistical temperature coefficient distribution in analog RRAM array: impact on neuromorphic system and mitigation method

2021 ◽  
Vol 55 (1) ◽  
pp. 015110
Author(s):  
Heng Xu ◽  
Yue Sun ◽  
Yangyang Zhu ◽  
Xiaohu Wang ◽  
Guoxuan Qin
2001 ◽  
Vol 700 ◽  
Author(s):  
Yasuo Cho

AbstractStudies on scanning electron-beam dielectric microscopy (SEDM) are reported. This microscopy technique is used for determining the temperature coefficient distribution of dielectric materials using an electron-beam as a heat source instead of a light beam as in photothermal dielectric microscopy. This microscopy technique, which has the ability to simultaneously observe SEM images and the material composition by EPMA, has a resolution better than that of photothermal dielectric microscopy. To demonstrate the usefulness of this technique, the two-dimensional image of a two-phase composite ceramic composed of TiO2 and Bi2Ti4O11 is measured. To shorten a measurement time, a new type of SEDM for measuring the real time transient response caused by a single pulsed electron-beam is also successfully developed. Finally, a quantitative measurement method of temperature coefficient is also developed.


Alloy Digest ◽  
1960 ◽  
Vol 9 (4) ◽  

Abstract EVANOHM is a nickel-base alloy having low temperature coefficient of resistance and high electrical resistivity. This datasheet provides information on composition, physical properties, hardness, and tensile properties. It also includes information on joining. Filing Code: Ni-57. Producer or source: Wilbur B. Driver Company.


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