Interaction of magnetized electrons with a boundary sheath: investigation of a specular reflection model

2017 ◽  
Vol 26 (11) ◽  
pp. 115009 ◽  
Author(s):  
Dennis Krüger ◽  
Ralf Peter Brinkmann
Keyword(s):  
Specular Reflection ◽  
Reflection Model

Development of a System to Measure the Optical Properties of Facial Skin using a 3D Camera and Projector

2021 ◽  
Author(s):  
Kumiko Kikuchi ◽  
Shoji Tominaga ◽  
Jon Y. Hardeberg
Keyword(s):  
Optical Properties ◽  
Diffuse Reflection ◽  
Specular Reflection ◽  
Three Dimensional ◽  
Depth Image ◽  
Facial Skin ◽  
Subsurface Scattering ◽  
Surface Reflection ◽  
Reflection Model ◽  
Reflection Component

We have developed a system to measure both the optical properties of facial skin and the three-dimensional shape of the face. To measure the three-dimensional facial shape, our system uses a light-field camera to provide a focused image and a depth image simultaneously. The light source uses a projector that produces a high-frequency binary illumination pattern to separate the subsurface scattering and surface reflections from the facial skin. Using a dichromatic reflection model, the surface reflection image of the skin can be separated further into a specular reflection component and a diffuse reflection component. Verification using physically controlled objects showed that the separation of the optical properties by the system correlated with the subsurface scattering, specular reflection, or diffuse reflection characteristics of each object. The method presented here opens new possibilities in cosmetology and skin pharmacology for measurement of the skin’s gloss and absorption kinetics and the pharmacodynamics of various external agents.

scholarly journals Квантовое трение и трение ван-дер-Ваальса в конфигурациях частица-пластина и пластина-пластина: нелокальные эффекты

2020 ◽  
Vol 62 (8) ◽  
pp. 1312
Author(s):  
Г.В. Дедков ◽  
А.А. Кясов
Keyword(s):  
Relative Motion ◽  
Constant Velocity ◽  
Specular Reflection ◽  
Au Nanoparticle ◽  
Friction Forces ◽  
Nonrelativistic Approximation ◽  
Dissipative Forces ◽  
Reflection Model ◽  
Gold Plate ◽  
Analytical Expressions

Within the nonrelativistic approximation of fluctuation electrodynamics, using the specular reflection model and nonlocal permittivity of the metal, we have obtained simple analytical expressions for friction forces in particle – plate and plate – plate systems at relative motion of bodies at a constant velocity. It has been shown that at distances of about 1–10 nm for an Au nanoparticle (or gold plate) moving near another (identical) plate at rest, dissipative forces prove to be 2–4 orders of magnitude higher than when using the local Drude dielectric function.

Forensic applications of IR infrared microscopic internal reflection spectroscopy

1992 ◽  
Vol 50 (2) ◽  
pp. 1528-1529
Author(s):  
Edward G. Bartick ◽  
John A. Reffner
Keyword(s):  
Specular Reflection ◽  
Forensic Analysis ◽  
Attenuated Total Reflection ◽  
Internal Reflection ◽  
Standard Size ◽  
Ir Microscopy ◽  
Ir Analysis ◽  
Plastic Explosives ◽  
Internal Reflection Spectroscopy ◽  
Reflectance Measurements

Since the introduction of commercial Fourier transform infrared (FTIR) microscopic systems in 1983, IR microscopy has developed as an important analytical tool in research, industry and forensic analysis. Because of the frequent encounter of small quantities of physical evidence found at crime scenes, spectroscopic IR microscopes have proven particularly valuable for forensic applications. Transmittance and reflectance measurements have proven very useful. Reflection-absorption, specular reflection, and diffuse reflection have all been applied. However, it has been only very recently that an internal reflection (IRS) objective has been commercially introduced.The IRS method, also known as attenuated total reflection (ATR), has proven very useful for IR analysis of standard size samples. The method has been applied to adhesive tapes, plastic explosives, and general applications in the analysis of opaque materials found as evidence. The small quantities or uncontaminated areas of specimens frequently found requiring forensic analysis will often be directly applicable to microscopic IRS analysis.

Valence electron energy loss spectroscopy in reflection geometry

1989 ◽  
Vol 47 ◽  
pp. 378-379
Author(s):  
J. Liu ◽  
J. M. Cowley
Keyword(s):  
Energy Loss ◽  
Valence Electron ◽  
Interband Transition ◽  
Specular Reflection ◽  
Three Dimensional ◽  
Electron Excitation ◽  
Transmission Electron ◽  
Yield Information ◽  
Valence Bands ◽  
Excitation Processes

The low energy loss region of a EELS spectrum carries information about the valence electron excitation processes (e.g., collective excitations for free electron like materials and interband transitions for insulators). The relative intensities and the positions of the interband transition energy loss peaks observed in EELS spectra are determined by the joint density of states (DOS) of the initial and final states of the excitation processes. Thus it is expected that EELS in reflection mode could yield information about the perturbation of the DOS of the conduction and valence bands of the bulk crystals caused by the termination of the three dimensional periodicity at the crystal surfaces. The experiments were performed in a Philipps 400T transmission electron microscope operated at 120 kV. The reflection EELS spectra were obtained by a Gatan 607 EELS spectrometer together with a Tracor data acquisition system and the resolution of the spectrometer was about 0.8 eV. All the reflection spectra are obtained from the specular reflection spots satisfying surface resonance conditions.

scholarly journals Specular Reflection Image Enhancement Based on a Dark Channel Prior

2021 ◽  
Vol 13 (1) ◽  
pp. 1-11
Author(s):  
Ye Xin ◽  
Zhenhong Jia ◽  
Jie Yang ◽  
Nikola K. Kasabov
Keyword(s):  
Image Enhancement ◽  
Specular Reflection ◽  
Dark Channel Prior ◽  
Dark Channel ◽  
Reflection Image

Real-time Approximation of Photometric Polygonal Lights

2020 ◽  
Vol 3 (1) ◽  
pp. 1-18
Author(s):  
Christian Luksch ◽  
Lukas Prost ◽  
Michael Wimmer
Keyword(s):  
Real Time ◽  
Specular Reflection ◽  
Near Field ◽  
Measurement Data ◽  
Data Sets ◽  
Photometric Measurement ◽  
Integration Technique ◽  
Time Approximation ◽  
Light Emitter ◽  
Selection Of

We present a real-time rendering technique for photometric polygonal lights. Our method uses a numerical integration technique based on a triangulation to calculate noise-free diffuse shading. We include a dynamic point in the triangulation that provides a continuous near-field illumination resembling the shape of the light emitter and its characteristics. We evaluate the accuracy of our approach with a diverse selection of photometric measurement data sets in a comprehensive benchmark framework. Furthermore, we provide an extension for specular reflection on surfaces with arbitrary roughness that facilitates the use of existing real-time shading techniques. Our technique is easy to integrate into real-time rendering systems and extends the range of possible applications with photometric area lights.

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