Surface relief subwavelength gratings by means of total internal reflection evanescent wave interference lithography

2006 ◽  
Vol 8 (4) ◽  
pp. S213-S218 ◽  
Author(s):  
J C Martinez-Anton
Volume 4 ◽  
2004 ◽  
Author(s):  
Arindam Banerjee ◽  
Kenneth D. Kihm

A novel three-dimensional tracking technique of nanoparticles in nanometer spatial resolution using a Ratiometric Total Internal Reflection Fluorescence Microscopy (R-TIRFM) is presented. Evanescent waves from the total internal reflection of an argon-ion laser (488 nm) are used to generate a thin sliced illumination field with its effective visualization range of 544-nm, equivalent to twice of the penetration depth of the evanescent wave field. Fluorescence-coated polystyrene spheres of 500-nm diameter (SG = 1.05) are used as tracers subjected to the Brownian diffusive motions. A ratiometric analysis of the fluorescence particle images together with a neural network particle-pair identification algorithm is used to track the tracer particle locations across multiple image frames in full three-dimensional ways. The techniques are used to examine the Brownian diffusive motion of nanoparticles as they approach the very near-wall region within a few hundred nanometers of a glass-water interface. The experimental results show that the measured Brownian diffusion coefficient is in good agreement with the theoretical hindered diffusion coefficient near a wall.


2007 ◽  
Vol 10 (1) ◽  
pp. 015001 ◽  
Author(s):  
Nicolas Passilly ◽  
Kalle Ventola ◽  
Petri Karvinen ◽  
Jari Turunen ◽  
Jani Tervo

Lab on a Chip ◽  
2016 ◽  
Vol 16 (16) ◽  
pp. 3007-3014 ◽  
Author(s):  
L. Liang ◽  
Y. F. Zuo ◽  
W. Wu ◽  
X. Q. Zhu ◽  
Y. Yang

An integrated optofluidic chip for restricted imaging, spectroscopy and counting of nanoparticles using the evanescent wave of total internal reflection at the interface of immiscible flows.


1997 ◽  
Vol 247 (1) ◽  
pp. 69-76 ◽  
Author(s):  
Ignacy Gryczynski ◽  
Zygmunt Gryczynski ◽  
Joseph R. Lakowicz

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