Effect of interface roughness on the carrier transport in germanium MOSFETs investigated by Monte Carlo method
2005 ◽
Vol 19
(21)
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pp. 3353-3377
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Keyword(s):
2010 ◽
Vol 31
(8)
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pp. 084004
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Keyword(s):
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1974 ◽
Vol 22
◽
pp. 307
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Keyword(s):
1990 ◽
Vol 48
(4)
◽
pp. 140-141