Characterization of InGaAs and InAlAs layers on InP by four-crystal high resolution X-ray diffraction and wedge transmission electron microscopy
1991 ◽
Vol 111
(1-4)
◽
pp. 456-460
◽
2005 ◽
Vol 19
(15n17)
◽
pp. 2508-2513
◽
1992 ◽
Vol 222
(1-2)
◽
pp. 221-226
◽
1982 ◽
Vol 40
◽
pp. 722-723
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2012 ◽
Vol 174-177
◽
pp. 508-511