Characterization of short-period Sim Gen superlattices by high-resolution transmission electron microscopy and X-ray diffraction
1992 ◽
Vol 222
(1-2)
◽
pp. 221-226
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1991 ◽
Vol 111
(1-4)
◽
pp. 456-460
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2005 ◽
Vol 19
(15n17)
◽
pp. 2508-2513
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1982 ◽
Vol 40
◽
pp. 722-723
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