A novel method for measuring carrier lifetime and capture cross-section by using the negative resistanceI-Vcharacteristics of a barrier-type thyristor
2010 ◽
Vol 31
(8)
◽
pp. 084005
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Keyword(s):
2003 ◽
Vol 40
(7)
◽
pp. 447-456
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Keyword(s):
1961 ◽
Vol 21
(1-2)
◽
pp. 1-9
◽
2002 ◽
Vol 39
(sup2)
◽
pp. 569-572
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Keyword(s):