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An effective work-function tuning method of nMOSCAP with high-k/metal gate by TiN/TaN double-layer stack thickness
Journal of Semiconductors
◽
10.1088/1674-4926/35/9/096001
◽
2014
◽
Vol 35
(9)
◽
pp. 096001
◽
Cited By ~ 4
Author(s):
Xueli Ma
◽
Hong Yang
◽
Wenwu Wang
◽
Huaxiang Yin
◽
Huilong Zhu
◽
...
Keyword(s):
Work Function
◽
Double Layer
◽
Metal Gate
◽
Effective Work
◽
Effective Work Function
◽
Tuning Method
◽
High K
◽
Work Function Tuning
Download Full-text
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References
Enabling Effective Work Function Tuning by RFPVD Metal Oxide on High-k Gate Dielectric
ECS Meeting Abstracts
◽
10.1149/ma2008-01/16/632
◽
2008
◽
Keyword(s):
Metal Oxide
◽
Work Function
◽
Gate Dielectric
◽
Effective Work
◽
Effective Work Function
◽
High K
◽
Work Function Tuning
◽
High K Gate Dielectric
Download Full-text
Effective Work Function Engineering for Aggressively Scaled Planar and FinFET-based Devices with High-k Last Replacement Metal Gate Tech.
10.7567/ssdm.2012.d-1-2
◽
2012
◽
Author(s):
A. Veloso
◽
S. A. Chew
◽
Y. Higuchi
◽
L. A. Ragnarsson
◽
E. Simoen
◽
...
Keyword(s):
Work Function
◽
Metal Gate
◽
Effective Work
◽
Effective Work Function
◽
High K
Download Full-text
In depth analysis of dopant effect on high-k metal gate effective work function
2012 13th International Conference on Ultimate Integration on Silicon (ULIS)
◽
10.1109/ulis.2012.6193345
◽
2012
◽
Cited By ~ 1
Author(s):
C. Leroux
◽
S. Baudot
◽
M. Charbonnier
◽
A. Van Deer Geest
◽
P. Caubet
◽
...
Keyword(s):
Work Function
◽
Metal Gate
◽
Dopant Effect
◽
Effective Work
◽
Effective Work Function
◽
High K
◽
Depth Analysis
Download Full-text
Effective work-function control technique applicable to p-type FinFET high-k/metal gate devices
Microelectronics Reliability
◽
10.1016/j.microrel.2017.04.004
◽
2017
◽
Vol 72
◽
pp. 80-84
◽
Cited By ~ 1
Author(s):
Shimpei Yamaguchi
◽
Zeynel Bayindir
◽
Xiaoli He
◽
Suresh Uppal
◽
Purushothaman Srinivasan
◽
...
Keyword(s):
Work Function
◽
Control Technique
◽
Metal Gate
◽
Effective Work
◽
Effective Work Function
◽
High K
◽
P Type
Download Full-text
Enabling Effective Work Function Tuning by RF-PVD Metal Oxide on High-k Gate Dielectric
ECS Transactions
◽
10.1149/1.2911493
◽
2019
◽
Vol 13
(1)
◽
pp. 143-150
◽
Cited By ~ 2
Author(s):
Naomi Yoshida
◽
Xianmin Tang
◽
Khaled Ahmed
◽
Giuseppina Conti
◽
Dave Liu
◽
...
Keyword(s):
Metal Oxide
◽
Work Function
◽
Gate Dielectric
◽
Effective Work
◽
Effective Work Function
◽
High K
◽
Work Function Tuning
◽
High K Gate Dielectric
Download Full-text
The effects of process condition of top-TiN and TaN thickness on the effective work function of MOSCAP with high-k/metal gate stacks
Journal of Semiconductors
◽
10.1088/1674-4926/35/10/106002
◽
2014
◽
Vol 35
(10)
◽
pp. 106002
◽
Cited By ~ 3
Author(s):
Xueli Ma
◽
Hong Yang
◽
Wenwu Wang
◽
Huaxiang Yin
◽
Huilong Zhu
◽
...
Keyword(s):
Work Function
◽
Process Condition
◽
Gate Stacks
◽
Metal Gate
◽
Effective Work
◽
Effective Work Function
◽
High K
Download Full-text
Role of interface dipole in metal gate/high-k effective work function modulation by aluminum incorporation
Applied Physics Letters
◽
10.1063/1.3159830
◽
2009
◽
Vol 94
(25)
◽
pp. 252905
◽
Cited By ~ 19
Author(s):
Z. C. Yang
◽
A. P. Huang
◽
L. Yan
◽
Z. S. Xiao
◽
X. W. Zhang
◽
...
Keyword(s):
Work Function
◽
Metal Gate
◽
Effective Work
◽
Effective Work Function
◽
Interface Dipole
◽
High K
Download Full-text
Fluorine implantation for effective work function control in p-type metal-oxide-semiconductor high-k metal gate stacks
Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
◽
10.1116/1.3521471
◽
2011
◽
Vol 29
(1)
◽
pp. 01A905
◽
Cited By ~ 1
Author(s):
A. Fet
◽
V. Häublein
◽
A. J. Bauer
◽
H. Ryssel
◽
L. Frey
Keyword(s):
Metal Oxide
◽
Work Function
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Gate Stacks
◽
Metal Gate
◽
Effective Work
◽
Effective Work Function
◽
High K
◽
P Type
Download Full-text
Effective Work Function Modulation by Aluminum Ion Implantation on Hf-Based High- $k$/Metal Gate pMOSFET
IEEE Electron Device Letters
◽
10.1109/led.2010.2066952
◽
2010
◽
Cited By ~ 3
Author(s):
Y. W. Chen
◽
C. M. Lai
◽
T. F. Chiang
◽
L. W. Cheng
◽
C. H. Yu
◽
...
Keyword(s):
Ion Implantation
◽
Work Function
◽
Metal Gate
◽
Effective Work
◽
Effective Work Function
◽
Aluminum Ion
◽
High K
Download Full-text
Demonstrating Valence Band-Edge Effective Work Function by Aluminum Implantation in High-k/Metal Gate p-MOSFET with Incorporated Fluorine
Journal of Electronic Materials
◽
10.1007/s11664-012-1957-1
◽
2012
◽
Vol 41
(7)
◽
pp. 1936-1940
Author(s):
Y.W. Chen
◽
C.M. Lai
◽
L.W. Cheng
◽
C.H. Hsu
◽
C.W. Liang
Keyword(s):
Work Function
◽
Valence Band
◽
Band Edge
◽
Valence Band Edge
◽
Metal Gate
◽
Effective Work
◽
Effective Work Function
◽
High K
◽
Aluminum Implantation
Download Full-text
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