An electronic component defect detection method based on SVM
2021 ◽
Vol 1982
(1)
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pp. 012109
2021 ◽
Vol 1827
(1)
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pp. 012167
Keyword(s):
2021 ◽
Vol 1754
(1)
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pp. 012025
2019 ◽
Vol 15
(5)
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pp. 2798-2809
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