scholarly journals A phase plate for transmission electron microscopy using the Aharonov-Bohm effect

2010 ◽  
Vol 241 ◽  
pp. 012005 ◽  
Author(s):  
C J Edgcombe
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Phase Plate ◽  
Transmission Electron ◽  
Bohm Effect ◽  
Aharonov Bohm

Bio-imaging of specimen in Liquid by using Environmental Phase plate Transmission Electron Microscopy

2012 ◽  
Vol 18 (S2) ◽  
pp. 1138-1139
Author(s):  
Y. Inayoshi ◽  
H. Minoda
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Phase Plate ◽  
Transmission Electron ◽  
Bio Imaging

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

scholarly journals High-resolution transmission electron microscopy with an electrostatic Zach phase plate

2016 ◽  
Vol 18 (5) ◽  
pp. 053005 ◽  
Author(s):  
S Hettler ◽  
M Dries ◽  
J Zeelen ◽  
M Oster ◽  
R R Schröder ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Phase Plate ◽  
Transmission Electron

A nanocrystalline Hilbert phase-plate for phase-contrast transmission electron microscopy

2014 ◽  
Vol 139 ◽  
pp. 29-37 ◽  
Author(s):  
M. Dries ◽  
S. Hettler ◽  
B. Gamm ◽  
E. Müller ◽  
W. Send ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Phase Contrast ◽  
Phase Plate ◽  
Transmission Electron

scholarly journals Single-particle cryo-EM: alternative schemes to improve dose efficiency

2021 ◽  
Vol 28 (5) ◽  
pp. 1343-1356
Author(s):  
Yue Zhang ◽  
Peng-Han Lu ◽  
Enzo Rotunno ◽  
Filippo Troiani ◽  
J. Paul van Schayck ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Radiation Damage ◽  
Information Transfer ◽  
Structural Information ◽  
High Energy ◽  
Phase Plate ◽  
Transmission Electron ◽  
Dose Efficiency ◽  
The Individual

Imaging of biomolecules by ionizing radiation, such as electrons, causes radiation damage which introduces structural and compositional changes of the specimen. The total number of high-energy electrons per surface area that can be used for imaging in cryogenic electron microscopy (cryo-EM) is severely restricted due to radiation damage, resulting in low signal-to-noise ratios (SNR). High resolution details are dampened by the transfer function of the microscope and detector, and are the first to be lost as radiation damage alters the individual molecules which are presumed to be identical during averaging. As a consequence, radiation damage puts a limit on the particle size and sample heterogeneity with which electron microscopy (EM) can deal. Since a transmission EM (TEM) image is formed from the scattering process of the electron by the specimen interaction potential, radiation damage is inevitable. However, we can aim to maximize the information transfer for a given dose and increase the SNR by finding alternatives to the conventional phase-contrast cryo-EM techniques. Here some alternative transmission electron microscopy techniques are reviewed, including phase plate, multi-pass transmission electron microscopy, off-axis holography, ptychography and a quantum sorter. Their prospects for providing more or complementary structural information within the limited lifetime of the sample are discussed.

A Comparison of Calculated Images Generated by Six Modes of Transmission Electron Microscopy

1974 ◽  
Vol 32 ◽  
pp. 368-369
Author(s):  
A. Engel ◽  
J. W. Wiggins ◽  
David Woodruff
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscope ◽  
Dark Field ◽  
Phase Plate ◽  
Modes Of Transmission ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Annular Detector ◽  
Conventional Electron Microscopy

Six modes of transmission electron microscopy are compared by a numerical simulation of the image formation assuming perfectly coherent illumination and ignoring the influence of radiation damage and noise. The comparison includes five modes of conventional electron microscopy (CEM): axial bright field, Unwin's phase plate, central stop dark field, tilted-beam dark field and conical illumination dark field, and the annular detector mode of the scanning transmission electron microscope (STEM).

On-Chip Thin Film Zernike Phase Plate for In-Focus Transmission Electron Microscopy Imaging of Organic Materials

ACS Nano ◽  
2012 ◽  
Vol 7 (1) ◽  
pp. 465-470 ◽  
Author(s):  
Pai-Chia Kuo ◽  
I-Hui Chen ◽  
Chih-Ting Chen ◽  
Ku-Pin Lee ◽  
Chun-Wei Chen ◽  
...  
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Organic Materials ◽  
Phase Plate ◽  
Microscopy Imaging ◽  
Transmission Electron ◽  
On Chip
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