Development of on-chip pattern processing in event-driven SOI pixel detector for X-ray astronomy with background rejection purpose

2020 ◽  
Vol 15 (12) ◽  
pp. P12025-P12025
Author(s):  
A. Takeda ◽  
K. Mori ◽  
Y. Nishioka ◽  
T. Hida ◽  
M. Yukumoto ◽  
...  
2015 ◽  
Author(s):  
Ayaki TAKEDA ◽  
Takeshi Tsuru ◽  
Takaaki Tanaka ◽  
Hideaki MATSUMURA ◽  
Yasuo Arai ◽  
...  
Keyword(s):  
X Ray ◽  

2021 ◽  
Vol 157 ◽  
pp. 175-181
Author(s):  
Maeva Bavoux ◽  
Yuji Kamio ◽  
Emmanuelle Vigneux-Foley ◽  
Julie Lafontaine ◽  
Ouafa Najyb ◽  
...  

2009 ◽  
Vol 4 (11) ◽  
pp. P11002-P11002 ◽  
Author(s):  
F Muleri ◽  
R Bellazzini ◽  
A Brez ◽  
E Costa ◽  
F Lazzarotto ◽  
...  
Keyword(s):  

2018 ◽  
Vol 25 (6) ◽  
pp. 1650-1657 ◽  
Author(s):  
Mohamad Khalil ◽  
Erik Schou Dreier ◽  
Jan Kehres ◽  
Jan Jakubek ◽  
Ulrik Lund Olsen

Timepix3 (256 × 256 pixels with a pitch of 55 µm) is a hybrid-pixel-detector readout chip that implements a data-driven architecture and is capable of simultaneous time-of-arrival (ToA) and energy (ToT: time-over-threshold) measurements. The ToA information allows the unambiguous identification of pixel clusters belonging to the same X-ray interaction, which allows for full one-by-one detection of photons. The weighted mean of the pixel clusters can be used to measure the subpixel position of an X-ray interaction. An experiment was performed at the European Synchrotron Radiation Facility in Grenoble, France, using a 5 µm × 5 µm pencil beam to scan a CdTe-ADVAPIX-Timepix3 pixel (55 µm × 55 µm) at 8 × 8 matrix positions with a step size of 5 µm. The head-on scan was carried out at four monochromatic energies: 24, 35, 70 and 120 keV. The subpixel position of every single photon in the beam was constructed using the weighted average of the charge spread of single interactions. Then the subpixel position of the total beam was found by calculating the mean position of all photons. This was carried out for all points in the 8 × 8 matrix of beam positions within a single pixel. The optimum conditions for the subpixel measurements are presented with regards to the cluster sizes and beam subpixel position, and the improvement of this technique is evaluated (using the charge sharing of each individual photon to achieve subpixel resolution) versus alternative techniques which compare the intensity ratio between pixels. The best result is achieved at 120 keV, where a beam step of 4.4 µm ± 0.86 µm was measured.


2014 ◽  
Vol 9 (05) ◽  
pp. C05015-C05015 ◽  
Author(s):  
R Dinapoli ◽  
A Bergamaschi ◽  
S Cartier ◽  
D Greiffenberg ◽  
I Johnson ◽  
...  
Keyword(s):  
X Ray ◽  

2014 ◽  
Vol 47 (1) ◽  
pp. 60-66 ◽  
Author(s):  
Armin Hoell ◽  
Zoltan Varga ◽  
Vikram Singh Raghuwanshi ◽  
Michael Krumrey ◽  
Christian Bocker ◽  
...  

The formation and growth of nanosized CaF2crystallites by heat treatment of an oxyfluoride glass of composition 7.65Na2O–7.69K2O–10.58CaO–12.5CaF2–5.77Al2O3–55.8SiO2(wt%) was investigated using anomalous small-angle X-ray scattering (ASAXS). A recently developed vacuum version of the hybrid pixel detector Pilatus 1M was used for the ASAXS measurements below the CaK-edge of 4038 eV down to 3800 eV. ASAXS investigation allows the determination of structural parameters such as size and size distribution of nanoparticles and characterizes the spatial distribution of the resonant element, Ca. The method reveals quantitatively that the growing CaF2crystallites are surrounded by a shell of lower electron density. This depletion shell of growing thickness hinders and finally limits the growth of CaF2crystallites. Moreover, in samples that were annealed for 10 h and more, additional very small heterogeneities (1.6 nm diameter) were found.


2021 ◽  
Vol 28 (3) ◽  
Author(s):  
Matthias Rössle ◽  
Wolfram Leitenberger ◽  
Matthias Reinhardt ◽  
Azize Koç ◽  
Jan Pudell ◽  
...  

The time-resolved hard X-ray diffraction endstation KMC-3 XPP for optical pump/X-ray probe experiments at the electron storage ring BESSY II is dedicated to investigating the structural response of thin film samples and heterostructures after their excitation with ultrashort laser pulses and/or electric field pulses. It enables experiments with access to symmetric and asymmetric Bragg reflections via a four-circle diffractometer and it is possible to keep the sample in high vacuum and vary the sample temperature between ∼15 K and 350 K. The femtosecond laser system permanently installed at the beamline allows for optical excitation of the sample at 1028 nm. A non-linear optical setup enables the sample excitation also at 514 nm and 343 nm. A time-resolution of 17 ps is achieved with the `low-α' operation mode of the storage ring and an electronic variation of the delay between optical pump and hard X-ray probe pulse conveniently accesses picosecond to microsecond timescales. Direct time-resolved detection of the diffracted hard X-ray synchrotron pulses use a gated area pixel detector or a fast point detector in single photon counting mode. The range of experiments that are reliably conducted at the endstation and that detect structural dynamics of samples excited by laser pulses or electric fields are presented.


2019 ◽  
Vol 27 (3) ◽  
pp. 3284 ◽  
Author(s):  
Y. Klein ◽  
A. Schori ◽  
I. P. Dolbnya ◽  
K. Sawhney ◽  
S. Shwartz

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