Measuring attenuation in signal propagation in Resistive-Plate Chambers

2021 ◽  
Vol 16 (01) ◽  
pp. P01001-P01001
Author(s):  
X.Y. Xie ◽  
Q.Y. Li ◽  
C.H. Tian ◽  
M. Yuan ◽  
Y.J. Sun
1997 ◽  
Vol 51 (2-3) ◽  
pp. 149-159
Author(s):  
K. M. Yemelyanov ◽  
Oleg Aleksandrovich Tretyakov ◽  
S. B. Nikitskiy
Keyword(s):  

2016 ◽  
pp. 3564-3575 ◽  
Author(s):  
Ara Sergey Avetisyan

The efficiency of virtual cross sections method and MELS (Magneto Elastic Layered Systems) hypotheses application is shown on model problem about distribution of wave field in thin surface layers of waveguide when plane wave signal is propagating in it. The impact of surface non-smoothness on characteristics of propagation of high-frequency horizontally polarized wave signal in isotropic elastic half-space is studied. It is shown that the non-smoothness leads to strong distortion of the wave signal over the waveguide thickness and along wave signal propagation direction as well.  Numerical comparative analysis of change in amplitude and phase characteristics of obtained wave fields against roughness of weakly inhomogeneous surface of homogeneous elastic half-space surface is done by classical method and by proposed approach for different kind of non-smoothness.


Author(s):  
Jim Vickers ◽  
Nader Pakdaman ◽  
Steven Kasapi

Abstract Dynamic hot-electron emission using time-resolved photon counting can address the long-term failure analysis and debug requirements of the semiconductor industry's advanced devices. This article identifies the detector performance parameters and components that are required to scale and keep pace with the industry's requirements. It addresses the scalability of dynamic emission with the semiconductor advanced device roadmap. It is important to understand the limitations to determining that a switching event has occurred. The article explains the criteria for event detection, which is suitable for tracking signal propagation and looking for logic or other faults in which timing is not critical. It discusses conditions for event timing, whose goal is to determine accurately when a switching event has occurred, usually for speed path analysis. One of the uses of a dynamic emission system is to identify faults by studying the emission as a general function of time.


2014 ◽  
Vol 35 (8) ◽  
pp. 2019-2023 ◽  
Author(s):  
Bao-lin Wei ◽  
Hong-wei Yue ◽  
Qian Zhou ◽  
Xue-ming Wei ◽  
Wei-lin Xu ◽  
...  

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