scholarly journals Associating Psychotic Symptoms with Altered Brain Anatomy in Psychotic Disorders Using Multidimensional Item Response Theory Models

2019 ◽  
Vol 30 (5) ◽  
pp. 2939-2947 ◽  
Author(s):  
Ana D Stan ◽  
Carol A Tamminga ◽  
Kihwan Han ◽  
Jong Bae Kim ◽  
Jaya Padmanabhan ◽  
...  

Abstract Reduced cortical thickness has been demonstrated in psychotic disorders, but its relationship to clinical symptoms has not been established. We aimed to identify the regions throughout neocortex where clinical psychosis manifestations correlate with cortical thickness. Rather than perform a traditional correlation analysis using total scores on psychiatric rating scales, we applied multidimensional item response theory to identify a profile of psychotic symptoms that was related to a region where cortical thickness was reduced. This analysis was performed using a large population of probands with psychotic disorders (N = 865), their family members (N = 678) and healthy volunteers (N = 347), from the 5-site Bipolar-Schizophrenia Network for Intermediate Phenotypes. Regional cortical thickness from structural magnetic resonance scans was measured using FreeSurfer; individual symptoms were rated using the Positive and Negative Syndrome Scale, Montgomery-Asberg Depression Rating Scale, and Young Mania Rating Scale. A cluster of cortical regions whose thickness was inversely related to severity of psychosis symptoms was identified. The regions turned out to be located contiguously in a large region of heteromodal association cortex including temporal, parietal and frontal lobe regions, suggesting a cluster of contiguous neocortical regions important to psychosis expression. When we tested the relationship between reduced cortical surface area and high psychotic symptoms we found no linked regions describing a related cortical set.

2011 ◽  
Vol 35 (8) ◽  
pp. 604-622 ◽  
Author(s):  
Hirotaka Fukuhara ◽  
Akihito Kamata

A differential item functioning (DIF) detection method for testlet-based data was proposed and evaluated in this study. The proposed DIF model is an extension of a bifactor multidimensional item response theory (MIRT) model for testlets. Unlike traditional item response theory (IRT) DIF models, the proposed model takes testlet effects into account, thus estimating DIF magnitude appropriately when a test is composed of testlets. A fully Bayesian estimation method was adopted for parameter estimation. The recovery of parameters was evaluated for the proposed DIF model. Simulation results revealed that the proposed bifactor MIRT DIF model produced better estimates of DIF magnitude and higher DIF detection rates than the traditional IRT DIF model for all simulation conditions. A real data analysis was also conducted by applying the proposed DIF model to a statewide reading assessment data set.


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