New area detector for atomic-resolution scanning transmission electron microscopy

2010 ◽  
Vol 59 (6) ◽  
pp. 473-479 ◽  
Author(s):  
N. Shibata ◽  
Y. Kohno ◽  
S. D. Findlay ◽  
H. Sawada ◽  
Y. Kondo ◽  
...  
2008 ◽  
Vol 14 (S2) ◽  
pp. 436-437 ◽  
Author(s):  
G Yang ◽  
Y Zhao ◽  
K Sader ◽  
A Bleloch ◽  
RF Klie

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008


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