Dependence of Secondary Electron Emission from MgO Single Crystals on Angle of Incidence

1960 ◽  
Vol 120 (3) ◽  
pp. 801-806 ◽  
Author(s):  
A. B. Laponsky ◽  
N. R. Whetten
Keyword(s):  
Single Crystals ◽  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
Angle Of Incidence

Dependence of Secondary Electron Emission upon Angle of Incidence of 1.3-Mev Primaries

1956 ◽  
Vol 102 (3) ◽  
pp. 682-686 ◽  
Author(s):  
R. A. Shatas ◽  
J. F. Marshall ◽  
M. A. Pomerantz
Keyword(s):  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
Angle Of Incidence

Untersuchungen zur Auftreffwinkelabhängigkeit des Emissionskoeffizienten für Sekundärelektronen und der Zerstäubungsausbeute beim Ionenbeschuß zylindrischer Proben im Plasma / Investigation of the Angular Dependence of the Secondary Electron Emission Coefficient and the Sputtering Yield by Ion Bombardment of Cylindrical Targets in a Plasma

1969 ◽  
Vol 24 (12) ◽  
pp. 1908-1914
Author(s):  
H Oechsner ◽  
W Gesang
Keyword(s):  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
Solid Surfaces ◽  
Angle Of Incidence ◽  
Emission Coefficient ◽  
Secondary Electron Emission Coefficient ◽  
Cylindrical Target ◽  
Sputtering Yield ◽  
Low Energy Ions

The influence of the angle of incidence of low energy ions on the emission of secondary particles from solid surfaces can be investigated by using cylindrical targets in a low pressure plasma. It is shown that the distribution of the angle of incidence of the impinging ions becomes independent of plasma conditions and bombarding parameters, when the diameter of the Langmuir sheath around the target is sufficiently large compared with that of the cylindrical target. Experimental results on the influence of the angle of ion incidence on the secondary electron emission coefficient and the sputtering yield are reported for polycrystalline Mo bombarded with A+-ions from 300 to 900 eV.

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