Interaction of spin-polarized atoms with a surface studied by optical-reflection spectroscopy

1996 ◽  
Vol 54 (3) ◽  
pp. 2169-2179 ◽  
Author(s):  
Stefan Grafström ◽  
Dieter Suter
Keyword(s):  
Reflection Spectroscopy ◽  
Optical Reflection ◽  
Spin Polarized ◽  
Polarized Atoms

scholarly journals Arthroscopic Evaluation of Knee Cartilage Using Optical Reflection Spectroscopy

2019 ◽  
Vol 8 (4) ◽  
pp. e399-e405 ◽  
Author(s):  
Justin L. Makovicka ◽  
Karan A. Patel ◽  
Jeffrey D. Hassebrock ◽  
David E. Hartigan ◽  
Michael Wong ◽  
...  
Keyword(s):  
Reflection Spectroscopy ◽  
Knee Cartilage ◽  
Optical Reflection ◽  
Arthroscopic Evaluation

Spin-Polarized Atoms in a Circularly Polarized Optical Dipole Trap

1999 ◽  
Vol 83 (7) ◽  
pp. 1311-1314 ◽  
Author(s):  
K. L. Corwin ◽  
S. J. M. Kuppens ◽  
D. Cho ◽  
C. E. Wieman
Keyword(s):  
Dipole Trap ◽  
Circularly Polarized ◽  
Optical Dipole Trap ◽  
Spin Polarized ◽  
Polarized Atoms

scholarly journals Optical reflection spectroscopy of thick corrosion layers on 304 stainless steel

2007 ◽  
Vol 49 (12) ◽  
pp. 4396-4414 ◽  
Author(s):  
R.A. Castelli ◽  
P.D. Persans ◽  
W. Strohmayer ◽  
V. Parkinson
Keyword(s):  
Stainless Steel ◽  
304 Stainless Steel ◽  
Reflection Spectroscopy ◽  
Optical Reflection

scholarly journals The Effect of Annealing Temperature On The Structural and Optical Properties of Si/SiO2 Composites Synthesized By Thermal Oxidation of Silicon Wafers

2021 ◽  
Author(s):  
Kamal Kayed ◽  
Dalal Baba Kurd
Keyword(s):  
Annealing Temperature ◽  
Silicon Oxide ◽  
Energy Gap ◽  
Silicon Wafers ◽  
Reflection Spectroscopy ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Optical Reflection ◽  
Relative Absorption

Abstract In this article, silicon wafers were thermal treated in air at temperatures from 800 to 1200 °C. The annealed samples were investigated using X-ray diffraction, FTIR and optical reflection spectroscopy. Unique result obtained includes that, that Kubelk-Munk curves could be utilized to estimate the ratio of oxidized silicon atoms. In addition, we found that these curves could provide information on the degree to which the nanoparticle formation affects both the reflection spectra and the energy gap of the Si/SiO2 composites. On the other hand, it has been found that, the intensity of the silicon peak in XRD spectra is proportional to the relative absorption coefficient of amorphous silicon oxide.

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