scholarly journals The Effect of Annealing Temperature On The Structural and Optical Properties of Si/SiO2 Composites Synthesized By Thermal Oxidation of Silicon Wafers

2021 ◽  
Author(s):  
Kamal Kayed ◽  
Dalal Baba Kurd
Keyword(s):  
Annealing Temperature ◽  
Silicon Oxide ◽  
Energy Gap ◽  
Silicon Wafers ◽  
Reflection Spectroscopy ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Optical Reflection ◽  
Relative Absorption

Abstract In this article, silicon wafers were thermal treated in air at temperatures from 800 to 1200 °C. The annealed samples were investigated using X-ray diffraction, FTIR and optical reflection spectroscopy. Unique result obtained includes that, that Kubelk-Munk curves could be utilized to estimate the ratio of oxidized silicon atoms. In addition, we found that these curves could provide information on the degree to which the nanoparticle formation affects both the reflection spectra and the energy gap of the Si/SiO2 composites. On the other hand, it has been found that, the intensity of the silicon peak in XRD spectra is proportional to the relative absorption coefficient of amorphous silicon oxide.

scholarly journals The effect of annealing temperature on the structural and optical properties of Si/SiO2 composites synthesized by thermal oxidation of silicon wafers

2021 ◽  
Author(s):  
Kamal Kayed ◽  
Dalal Baba Kurd
Keyword(s):  
Annealing Temperature ◽  
Silicon Oxide ◽  
Energy Gap ◽  
Silicon Wafers ◽  
Reflection Spectroscopy ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Optical Reflection ◽  
Relative Absorption

Abstract In this article, silicon wafers were thermal treated in air at temperatures from 800 to 1200°C. The annealed samples were investigated using X-ray diffraction, FTIR and optical reflection spectroscopy. Unique result obtained includes that, that Kubelk-Munk curves could be utilized to estimate the ratio of oxidized silicon atoms. In addition, we found that these curves could provide information on the degree to which the nanoparticle formation affects both the reflection spectra and the energy gap of the Si/SiO2 composites. On the other hand, it has been found that, the intensity of the silicon peak in XRD spectra is proportional to the relative absorption coefficient of amorphous silicon oxide.

scholarly journals Laser induced plasma of cadmium oxide: structural, morphological and optical properties

2021 ◽  
Vol 2114 (1) ◽  
pp. 012012
Author(s):  
Tamara S. Hussein ◽  
Ala F. Ahmed
Keyword(s):  
Optical Properties ◽  
Energy Gap ◽  
Cadmium Oxide ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
Optical Energy Gap ◽  
X Ray ◽  
Laser Induced Plasma ◽  
Atomic Force ◽  
Doping Ratio

Abstract In this study, the effect of grafting with Iron (Fe) ratios (0.1, 0.3 and 0.5) on the structural and optical properties of cadmium oxide films (CdO) was studied, as these films were prepared on glass bases using the method of pulse laser deposition (PLD). The crystallization nature of the prepared films was examined by X-ray diffraction technique (XRD), which showed that the synthesis of the prepared films is polycrystalline, and Atomic Force Microscope (AFM) images also showed that the increased vaccination with Iron led to an increase in the crustal size ratio and a decrease in surface roughness, The absorption coefficient was calculated and the optical energy gap for the prepared thin films. It was found the absorption decreases and the energy gap decreases with the increase of doping ratio.

Morphology and orientation of thin poly(3-hexylthiophene) (P3HT) films on differently silanized silicon oxide

e-Polymers ◽  
2009 ◽  
Vol 9 (1) ◽  
Author(s):  
Guido Scavia ◽  
William Porzio ◽  
Silvia Destri ◽  
Alberto Giacometti Schieroni ◽  
Fabio Bertini
Keyword(s):  
Annealing Temperature ◽  
Silicon Oxide ◽  
Alkyl Chain ◽  
Alkyl Chain Length ◽  
Thin Layers ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Xrd Techniques

AbstractThe morphology and structure of the overlying poly(3-hexylthiophene) (P3HT) layer onto differently silanized silicon oxide has been studied by Atomic Force Microscopy (AFM) and X-Ray Diffraction (XRD) techniques. By increasing the silanizer alkyl chain length, the layer morphology evolves from a filament like to globular needle like as a consequence of the different SAM organization, while the P3HT conformation remains edge-on. For each case the effect of the annealing temperature has been studied. For all the cases a particular attention has been paid to the first thin layers close to the interface P3HT/SiOx. The effect of a polar substituent and presence of aromatic ring has been also studied.

scholarly journals The Effect of Oxidation Temperature on the (1000–1300) Cm−1 Band in FT-IR Spectra of Silicon Oxide Synthesized by Thermal Oxidation of Silicon Wafers

2021 ◽  
Author(s):  
Kamal Kayed ◽  
Dalal Baba Kurd
Keyword(s):  
Ir Spectra ◽  
Thermal Oxidation ◽  
Silicon Nanoparticles ◽  
Silicon Oxide ◽  
Longitudinal Optical ◽  
Silicon Wafers ◽  
Reflection Spectroscopy ◽  
X Ray Diffraction ◽  
Ft Ir ◽  
Overlapping Peaks

Abstract In this work, silicon wafers were thermal treated in air at temperatures varied in the range 800–1200°C. The annealed samples were investigated using FTIR, X-ray diffraction, FTIR and optical reflection spectroscopy. The effect of annealing temperature on the (1000–1300) cm− 1 band in FT-IR spectra of the prepared samples was investigated. The results showed that thermal oxidation at temperatures less than 1200°C leads to enhance the phenomenon of the splitting of longitudinal optical and transverse optical stretching motions. This phenomenon was verified by observing the appearance of two overlapping peaks in the region (1000–1300) cm− 1 in FT-IR spectra. The results also showed that the splitting process leads to the formation of defects in the crystal structure of silicon, which in turn leads to the formation of silicon nanoparticles.

scholarly journals Influence of Laser Energy and Annealing on Structural and Optical Properties of CdS Films Prepared by Laser Induced Plasma

2020 ◽  
pp. 1307-1312
Author(s):  
Wadaa S. Hussein ◽  
Ala' Fadhil Ahmed ◽  
Kadhim A. Aadim
Keyword(s):  
Optical Properties ◽  
Annealing Temperature ◽  
Laser Energy ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Laser Induced Plasma ◽  
Visible Spectra ◽  
Uv Visible ◽  
Diffraction Patterns

The current study was achieved on the effects of laser energy and annealing temperature on x-ray structural and optical properties, such as the UV-Visible spectra of cadmium sulfide (CdS). The films were prepared using pules laser deposition technique (PLD) under vacuum at a pressure of 2.5×10-2 mbar with different laser energies (500-800 mJ) and annealing at a temperature of 473K. X-ray diffraction patterns and intensity curves for the CdS showed that the formation of CdS multi-crystallization films at all laser energies. The optical properties of the films were studied and the variables affecting them were investigated in relation to laser energy and changes in temperature.

scholarly journals Temperature effect on structural and optical properties of V2O5 thin films prepared by spray pyrolysis technique

2020 ◽  
Vol 307 ◽  
pp. 01033
Author(s):  
Asmaa Mrigal ◽  
Lahocine El Gana ◽  
Mouhamed Addou ◽  
Khadija Bahedi ◽  
Rajae Temsamani ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Energy Gap ◽  
Spray Pyrolysis Technique ◽  
Three Dimensional ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Glass Substrates ◽  
Optical Dielectric Constant

In this work, the effect of substrate temperature on structural and optical properties of V2O5 thin films has been characterized by X-ray diffraction (XRD); SEM and transmission. The films mince has been prepared by Reactive Chemical Spraying technology in Liquid Phase (RCSLP) on glass substrates preheated at (350, 400, 450 and 500 °C). The X-ray diffraction analysis confirms that all layers are polycrystalline, and the preferred orientation of V2O5 is the (001) plane. The morphology of V2O5 thin films are porous nature and their particle’s shape is three-dimensional. The transmittance and absorbance of thin film were measured from which the optical constants (Energy gap, Refractive index, Absorption coefficient, Extinction coefficient and Optical dielectric constant) were determined.

scholarly journals Synthesis and Characterization of 〖(CdO)〗_(1-x) 〖Mg〗_x films by pulsed laser deposition

2020 ◽  
Vol 18 (45) ◽  
pp. 59-67
Author(s):  
Jasim Mohamad Hussain ◽  
Awatif S Jasim ◽  
Kadhim Abdulwahid Aadim
Keyword(s):  
Absorption Coefficient ◽  
Energy Gap ◽  
Cadmium Oxide ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
Optical Energy Gap ◽  
X Ray

In this study, the effect of grafting with magnesium (Mg) ratios (0.1, 0.3, 0.5) on the structural and optical properties of cadmium oxide films (CdO) was studied, as these films were prepared on glass bases using the method of pulse laser deposition (PLD). The crystallization nature of the prepared membranes was examined by X-ray diffraction technique (XRD), which showed that the synthesis of the prepared membranes is polycrystalline, and (AFM) images also showed that the increased deformation with magnesium led to an increase in the grain size ratio and a decrease in surface roughness, as well as the absorption coefficient was calculated. And the optical energy gap for the prepared membranes, where it was found that the absorption coefficient increases with the increase in the proportion of vaccination and that the energy gap decreases with increasing rates of vaccination.

scholarly journals INFLUENCE OF ANNEALING TEMPERATURE ON THE STRUCTURAL AND OPTICAL PROPERTIES OF COPPER IODIDE THIN FILMS

2021 ◽  
Vol 03 (02) ◽  
pp. 100-108
Author(s):  
Zuheer. N MAJEED ◽  
Nadia Naeema DAHAHER ◽  
Ebtisam K ALWAN
Keyword(s):  
Thin Films ◽  
Annealing Temperature ◽  
Energy Gap ◽  
Target Surface ◽  
Optical Measurements ◽  
Cubic Phase ◽  
Copper Iodide ◽  
X Ray Diffraction ◽  
X Ray ◽  
Annealing Temperatures

Copper Iodide (CuI) nanoparticles with (250 nm) thickness have been prepared at RT on glass substrate using PLD technique with focused Nd:YAG laser beam at (800 mJ) with a frequency second radiation at (1064 nm) (pulse width 9 ns) repetition frequency (6 Hz), for 500 laser pulses incident on the target surface . The films annealed to different annealing temperatures (423K )and(523K). The structural and surface morphology properties of the deposited CuI thin films were examined by X-ray diffraction analysis (XRD) and Atomic force microscope (AFM). The X-ray diffraction show that structure is a cubic phase with (111) plane preferential orientation direction. AFM was used to examine and measure the morphology and average diameter for CuI thin films respectively. It is observed that the average nanoparticles size increases with increasing of annealing temperature. The optical measurements showed that CuI thin films have direct allowed energy gap transition and the energy gap (Eg) decreases from (3.2eV) to (2.8 eV) with increasing annealing temperatures from RT to (532 K) for all samples.

scholarly journals Effect of Indium Doping on the Structural and Optical Properties of CdO thin films

2019 ◽  
Vol 24 (3) ◽  
pp. 84
Author(s):  
Muthanna K. Mahmood1 ◽  
Hanan R. A. Ali1 ◽  
Khudheir A. Mishjil2
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Doping Concentration ◽  
Energy Gap ◽  
Mean Square ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Indium Doping ◽  
Cdo Thin Films

The aim of this study is to investigate the effect of indium doping on structural and optical characteristics of CdO thin films prepared by spray pyrolysis. According to x-ray diffraction analysis, the studied samples are polycrystalline with preferred orientation along (111) orientation. The surface topography determined by AFM and SEM indicates that the surface roughness and root mean square (RMS) values were increased as the indium doping concentration increased. The determinedoptical energy gap were found to lie between (2.47-2.84)eV.   http://dx.doi.org/10.25130/tjps.24.2019.051

scholarly journals Structural and Optical Properties of ZnO-CdO Nanocomposite Using Electrodeposition Method

2016 ◽  
Vol 63 ◽  
pp. 127-133 ◽  
Author(s):  
Zehraa N. Abdul-Ameer ◽  
Ibrahim R. Agool
Keyword(s):  
Grain Size ◽  
Optical Properties ◽  
Surface Morphology ◽  
Electrochemical Deposition ◽  
Energy Gap ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
Optical Energy Gap ◽  
X Ray ◽  
Shift Behavior

ZnO,CdO,ZnO-CdO nanocomposite were prepared using electrochemical deposition the prepared samples were characterized using X-ray diffraction and the photoluminenscence spectroscopy (PL) to get the surface morphology leading to calculation of optical energy gap .the grain size determined by Scherrer's equation (22-25) nm .through the calculation of Eg ,it was noticed a red shift behavior in ZnO manner due to addition of CdO content

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