scholarly journals Beam dynamics issues for the two-frequency crab cavity short pulse scheme

Author(s):  
Xiaobiao Huang ◽  
Bob Hettel ◽  
Tom Rabedeau ◽  
James Safranek ◽  
Jim Sebek ◽  
...  
Keyword(s):  
1985 ◽  
Vol 52 (3) ◽  
pp. 517-522 ◽  
Author(s):  
P. S. Symonds ◽  
T. X. Yu

In a particular example of short pulse loading on a pin-ended beam, the permanent deflection is predicted by a numerical solution to be in the direction opposite that of the load. Analysis of a Shanley-type model shows that this surprising behavior may occur as a consequence of plastic irreversibility combined with geometric nonlinearity, when the peak deflection produced by the pulse lies in a certain range of small magnitudes. Results from a number of well-known structural dynamics codes are shown. These exhibit a wide spread in the predicted final deflections, indicating strong sensitivities of both physical and computational nature.


2017 ◽  
Vol 187 (11) ◽  
pp. 1280-1287 ◽  
Author(s):  
Leonid V. Keldysh

2013 ◽  
Vol 20 (2) ◽  
pp. 183-190 ◽  
Author(s):  
A. Barna ◽  
I. B. Földes ◽  
Z. Gingl ◽  
R. Mingesz

Abstract In experiments with short-pulse lasers the measurement control of the energy of the laser pulse is of crucial importance. Generally it is difficult to measure the amplitude of the pulses of short-pulse lasers using electronic devices, their response time being longer than the duration of the laser pulses. The electric response of the detector is still too fast to be directly digitized therefore a peak-hold unit can be used to allow data processing for the computer. In this paper we present a device which measures the energy of UV short (fs) pulses shot-byshot, digitizes and sends the data to the PC across an USB interface. The circuit is based on an analog peak detect and hold unit and the use of fiber optical coupling between the PC and the device provides a significant improvement to eliminate potential ground loops and to reduce conductive and radiated noise as well. The full development is open source and has been made available to download from our web page (http://www.noise.inf.u-szeged.hu/Instruments/PeakHold/).


Author(s):  
F. Beaudoin ◽  
P. Perdu ◽  
C. DeNardi ◽  
R. Desplats ◽  
J. Lopez ◽  
...  

Abstract Ultra-short pulse laser ablation is applied to IC backside sample preparation. It is contact-less, non-thermal, precise and can ablate the various types of material present in IC packages. This study concerns the optimization of ultra-short pulse laser ablation for silicon thinning. Uncontrolled silicon roughness and poor uniformity of the laser thinned cavity needed to be tackled. Special care is taken to minimize the silicon RMS roughness to less than 1µm. Application to sample preparation of 256Mbit devices is presented.


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