Interface Effects Induced by a
ZrO2
Seed Layer on the Phase Stability and Orientation of
HfO2
Ferroelectric Thin Films: A First-Principles Study
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):
2018 ◽
Vol 137
◽
pp. 295-302
◽
2001 ◽
Vol 11
(PR11)
◽
pp. Pr11-9-Pr11-19
◽
2017 ◽
Vol 727
◽
pp. 579-595
◽
Keyword(s):
2010 ◽
Vol 13
(4)
◽
pp. 295-297
◽