scholarly journals Relationship between crystal chemistry and the local structure and electronic properties ofTl2Ba2Ca2Cu3O10superconductors determined by scanning tunneling microscopy and spectroscopy

1992 ◽  
Vol 45 (2) ◽  
pp. 987-992 ◽  
Author(s):  
Zhe Zhang ◽  
Chia-Chun Chen ◽  
Charles M. Lieber ◽  
Bruno Morosin ◽  
David S. Ginley ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Electronic Properties ◽  
Crystal Chemistry ◽  
Local Structure ◽  
Scanning Tunneling ◽  
Tunneling Microscopy

scholarly journals On-surface synthesis of singly and doubly porphyrin-capped graphene nanoribbon segments

2021 ◽  
Vol 12 (1) ◽  
pp. 247-252
Author(s):  
Luis M. Mateo ◽  
Qiang Sun ◽  
Kristjan Eimre ◽  
Carlo A. Pignedoli ◽  
Tomas Torres ◽  
...  
Keyword(s):  
High Resolution ◽  
Dft Calculations ◽  
Scanning Tunneling Microscopy ◽  
Electronic Properties ◽  
Graphene Nanoribbon ◽  
Scanning Tunneling ◽  
Tunneling Microscopy

Singly and doubly porphyrin-capped graphene nanoribbon segments are reported and their electronic properties are studied by high-resolution scanning tunneling microscopy and spectroscopy, and DFT calculations.

Identifying the electronic properties of the Ge(111)-(2×1) surface by low-temperature scanning tunneling microscopy

JETP Letters ◽  
2005 ◽  
Vol 82 (5) ◽  
pp. 279-283 ◽  
Author(s):  
P. I. Arseyev ◽  
N. S. Maslova ◽  
V. I. Panov ◽  
S. V. Savinov ◽  
C. Van Haesendonck
Keyword(s):  
Low Temperature ◽  
Scanning Tunneling Microscopy ◽  
Electronic Properties ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Temperature Scanning

Scanning Tunneling Microscopy and Spectroscopy of Semiconductor Surfaces

1986 ◽  
Vol 77 ◽  
Author(s):  
J. E. Demuth ◽  
R. J. Hamers ◽  
R. M. Tromp
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Local Structure ◽  
Localized States ◽  
Silicon Surfaces ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Geometric Information ◽  
Charge Densities ◽  
Surface Electronic Structure ◽  
New Information

ABSTRACTThe principles of scanning tunneling microscopy and its application to study silicon surfaces are briefly reviewed. Scanning tunneling microscopy “topographs” contain both geometric information about the locations of atoms at the surface as well as about the charge densities of surface localized states. We describe procedures by which these two components can be distinguished so as to produce images of the surface electronic states with atomic resolution. This ability to spatially resolve the surface electronic structure provides new information to understand the local structure and nature of bonding, and in some cases can be used as a means to chemically image specific features of the surface.

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