On-surface synthesis of singly and doubly porphyrin-capped graphene nanoribbon segments

Singly and doubly porphyrin-capped graphene nanoribbon segments are reported and their electronic properties are studied by high-resolution scanning tunneling microscopy and spectroscopy, and DFT calculations.

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Revealing the high-resolution structures and electronic properties of ZnTPP and its derivatives formed by thermally induced cyclodehydrogenation on Au(111)

Physical Chemistry Chemical Physics ◽

10.1039/d1cp03074d ◽

2021 ◽

Author(s):

Wei Xiong ◽

Xiang Ren ◽

Binbin Da ◽

Yong Zhang ◽

Hui Zhang ◽

...

Keyword(s):

Solar Cells ◽

High Resolution ◽

Scanning Tunneling Microscopy ◽

Electronic Properties ◽

Supramolecular Chemistry ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Thermally Induced ◽

Broad Application ◽

Application Prospects

Zinc(II) tetraphenylporphyrin (ZnTPP) has very broad application prospects in the fields of supramolecular chemistry, solar cells and nanomaterials. In this paper, by using scanning tunneling microscopy (STM), we systematically investigated...

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Practical applications of scanning tunneling microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100152069 ◽

1989 ◽

Vol 47 ◽

pp. 18-19

Author(s):

D. R. Denley

Keyword(s):

High Resolution ◽

Scanning Tunneling Microscopy ◽

Quantitative Information ◽

Digital Data ◽

Scanning Tunneling ◽

Ambient Atmosphere ◽

Tunneling Microscopy ◽

Clear Trend ◽

Practical Applications ◽

Promising Tool

Scanning tunneling microscopy (STM) has recently been introduced as a promising tool for analyzing surface atomic structure. We have used STM for its extremely high resolution (especially the direction normal to surfaces) and its ability for imaging in ambient atmosphere. We have examined surfaces of metals, semiconductors, and molecules deposited on these materials to achieve atomic resolution in favorable cases.When the high resolution capability is coupled with digital data acquisition, it is simple to get quantitative information on surface texture. This is illustrated for the measurement of surface roughness of evaporated gold films as a function of deposition temperature and annealing time in Figure 1. These results show a clear trend for which the roughness, as well as the experimental deviance of the roughness is found to be minimal for evaporation at 300°C. It is also possible to contrast different measures of roughness.

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Scanning tunneling microscopy of polymers: A status report

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100153622 ◽

1989 ◽

Vol 47 ◽

pp. 330-331

Author(s):

P.E. Russell ◽

I.H. Musselman

Keyword(s):

High Resolution ◽

Scanning Tunneling Microscopy ◽

Sample Surface ◽

Atomic Scale ◽

Constant Current ◽

Scanning Tunneling ◽

Status Report ◽

Tunneling Microscopy ◽

Research Issues ◽

Wide Range

Scanning tunneling microscopy (STM) has evolved rapidly in the past few years. Major developments have occurred in instrumentation, theory, and in a wide range of applications. In this paper, an overview of the application of STM and related techniques to polymers will be given, followed by a discussion of current research issues and prospects for future developments. The application of STM to polymers can be conveniently divided into the following subject areas: atomic scale imaging of uncoated polymer structures; topographic imaging and metrology of man-made polymer structures; and modification of polymer structures. Since many polymers are poor electrical conductors and hence unsuitable for use as a tunneling electrode, the related atomic force microscopy (AFM) technique which is capable of imaging both conductors and insulators has also been applied to polymers.The STM is well known for its high resolution capabilities in the x, y and z axes (Å in x andy and sub-Å in z). In addition to high resolution capabilities, the STM technique provides true three dimensional information in the constant current mode. In this mode, the STM tip is held at a fixed tunneling current (and a fixed bias voltage) and hence a fixed height above the sample surface while scanning across the sample surface.

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