Local structure and dynamics of a segregatedc(2×2) sulfur layer on Pd(001) studied by scanning tunneling microscopy

1993 ◽  
Vol 47 (15) ◽  
pp. 9963-9966 ◽  
Author(s):  
D. Bürgler ◽  
G. Tarrach ◽  
T. Schaub ◽  
R. Wiesendanger ◽  
H.-J. Güntherodt
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Local Structure ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Structure And Dynamics ◽  
Sulfur Layer

Structure and Dynamics of Tetramethylthiourea Adsorption on Au(111) Studied by in Situ Scanning Tunneling Microscopy

Langmuir ◽  
1996 ◽  
Vol 12 (12) ◽  
pp. 3060-3066 ◽  
Author(s):  
E. Bunge ◽  
R. J. Nichols ◽  
B. Roelfs ◽  
H. Meyer ◽  
H. Baumgärtel
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Structure And Dynamics

Scanning Tunneling Microscopy and Spectroscopy of Semiconductor Surfaces

1986 ◽  
Vol 77 ◽  
Author(s):  
J. E. Demuth ◽  
R. J. Hamers ◽  
R. M. Tromp
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Local Structure ◽  
Localized States ◽  
Silicon Surfaces ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Geometric Information ◽  
Charge Densities ◽  
Surface Electronic Structure ◽  
New Information

ABSTRACTThe principles of scanning tunneling microscopy and its application to study silicon surfaces are briefly reviewed. Scanning tunneling microscopy “topographs” contain both geometric information about the locations of atoms at the surface as well as about the charge densities of surface localized states. We describe procedures by which these two components can be distinguished so as to produce images of the surface electronic states with atomic resolution. This ability to spatially resolve the surface electronic structure provides new information to understand the local structure and nature of bonding, and in some cases can be used as a means to chemically image specific features of the surface.

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