Generalized Laue dynamical theory for x-ray reflectivity at low and high incidence angles on strained multilayers

1997 ◽  
Vol 56 (15) ◽  
pp. 9744-9752 ◽  
Author(s):  
L. De Caro ◽  
C. Giannini ◽  
L. Tapfer
Keyword(s):  
Dynamical Theory ◽  
X Ray ◽  
High Incidence

Crystal truncation rod X-ray scattering: exact dynamical calculation

2008 ◽  
Vol 41 (1) ◽  
pp. 18-26 ◽  
Author(s):  
Václav Holý ◽  
Paul F. Fewster
Keyword(s):  
Reciprocal Lattice ◽  
Dynamical Theory ◽  
Lattice Points ◽  
Space Distribution ◽  
Matrix Formalism ◽  
X Ray ◽  
Transmission Coefficients ◽  
X Ray Scattering ◽  
Crystal Truncation Rod ◽  
Scattering Geometry

A new method is presented for a calculation of the reciprocal-space distribution of X-ray diffracted intensity along a crystal truncation rod. In contrast to usual kinematical or dynamical approaches, the method is correct both in the reciprocal-lattice points and between them. In the method, the crystal is divided into a sequence of very thin slabs parallel to the surface; in contrast to the well known Darwin dynamical theory, the electron density in the slabs is constant along the surface normal. The diffracted intensity is calculated by a matrix formalism based on the Fresnel reflection and transmission coefficients. The method is applicable for any polarization of the primary beam and also in a non-coplanar scattering geometry.

Investigation of the phase shift in X-ray forward diffraction using an X-ray interferometer

1998 ◽  
Vol 5 (3) ◽  
pp. 967-968 ◽  
Author(s):  
Keiichi Hirano ◽  
Atsushi Momose
Keyword(s):  
Phase Shift ◽  
Silicon Crystal ◽  
Dynamical Theory ◽  
Perfect Crystal ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Bragg Geometry

The phase shift of forward-diffracted X-rays by a perfect crystal is discussed on the basis of the dynamical theory of X-ray diffraction. By means of a triple Laue-case X-ray interferometer, the phase shift of forward-diffracted X-rays by a silicon crystal in the Bragg geometry was investigated.

Multiple reflection optimization package for X-ray diffraction

CrystEngComm ◽  
2021 ◽  
Author(s):  
S. Magalhães ◽  
J. S. Cabaço ◽  
J. P. Araújo ◽  
E. Alves
Keyword(s):  
Dynamical Theory ◽  
Multiple Reflection ◽  
X Ray Diffraction ◽  
X Ray

New software for the simulation and fitting of 2θ–ω scans of symmetric and asymmetric reflections based on the dynamical theory of X-ray diffraction is presented.

An algorithm for calculating diffraction profiles of 2θ scans for multiple diffraction from crystals and thin films

2014 ◽  
Vol 70 (6) ◽  
pp. 572-582
Author(s):  
Hsin-Yi Chen ◽  
Mau-Sen Chiu ◽  
Chia-Hung Chu ◽  
Shih-Lin Chang
Keyword(s):  
Initial Phase ◽  
Atomic Layer ◽  
Dynamical Theory ◽  
Far Field ◽  
X Rays ◽  
X Ray Diffraction ◽  
Multiple Diffraction ◽  
X Ray ◽  
Beam Surface ◽  
Surface Diffraction

An algorithm is developed based on the dynamical theory of X-ray diffraction for calculating the profiles of the diffracted beam,i.e.the diagrams of the intensity distributionversus2θ when a crystal is fixed at an angle of its maximum diffracted intensity. Similar to Fraunhofer (far-field) diffraction for a single-slit case, in the proposed algorithm the diffracted beam from one atomic layer excited by X-rays is described by the composition of (N+ 1) coherent point oscillators in the crystal. The amplitude and the initial phase of the electric field for each oscillator can be calculated based on the dynamical theory with given boundary conditions. This algorithm not only gives diffraction profiles but also provides the contribution of the excitation of modes when extremely asymmetric diffraction is involved in the diffraction process. Examples such as extremely asymmetric two-beam surface diffraction and three-beam surface diffraction are presented and discussed in detail.

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