Micrometer x-ray diffraction study ofVO2films: Separation between metal-insulator transition and structural phase transition
2001 ◽
Vol 86
(19)
◽
pp. 4346-4349
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Keyword(s):
2000 ◽
Vol 13
(2)
◽
pp. L45-L48
◽
2011 ◽
Vol 184
(4)
◽
pp. 893-898
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Keyword(s):
2001 ◽
Vol 226-230
◽
pp. 233-234
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Keyword(s):
2012 ◽
Vol 152
(6)
◽
pp. 509-512
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Keyword(s):
2001 ◽
Vol 312
(1-2)
◽
pp. 31-37
Keyword(s):
1985 ◽
Vol 24
(S2)
◽
pp. 257
◽
Keyword(s):
1990 ◽
Vol 29
(Part 1, No. 12)
◽
pp. 2763-2767
Keyword(s):