scholarly journals Identifying different stacking sequences in few-layer CVD-grownMoS2by low-energy atomic-resolution scanning transmission electron microscopy

2016 ◽  
Vol 93 (4) ◽  
Author(s):  
Aiming Yan ◽  
Wei Chen ◽  
Colin Ophus ◽  
Jim Ciston ◽  
Yuyuan Lin ◽  
...  
2008 ◽  
Vol 14 (S2) ◽  
pp. 436-437 ◽  
Author(s):  
G Yang ◽  
Y Zhao ◽  
K Sader ◽  
A Bleloch ◽  
RF Klie

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008


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